Here is the abstract you requested from the Automotive_2007 technical program page. This is the original abstract submitted by the author. Any changes to the technical content of the final manuscript published by IMAPS or the presentation that is given during the event is done by the author, not IMAPS.
|State-of-the-Art Test Procedures for Hybrid and LTCC Multilayers|
|Keywords: test pattern, LTCC, hybrid|
|Ceramic circuits made by hybrid and LTCC technology are often used for automotive applications. Highly integrated multilayer build-ups require a high level of compatibility and refiring stability of conductors, resistors and the dielectric. LTCC circuits lack the stabilizing core of alumina, therefore materials additionally need to show uniform sintering to provide mechanical stability and repeatable geometry. State of the art test procedures need to reflect on an increased mileage between service intervals, as well as elevated working temperatures. This increased reliability must be compatible with ever increasing integration density and cost sensitive large volume production processes. New multi-functional test patterns have been designed in close cooperation with automotive customers. Performance in printing on large panel geometries as well as via and line resolution are tested in the same time as the compatibility of materials. Large ground planes and corresponding top electrodes address designers actual and future expectations in break down voltage or insulation resistance at a 2 layer build-up of the dielectric. Critical active and passive components, attached by lead free solders or conductive adhesives are used for population and their reliability can be tested over a wide range of environmental conditions. The inclusion of various diameters of Au and Al bond wires then offer a detailed picture of thick film materials as a system. Test loops under harsh conditions like –40/+150°C shock cycling, long term storage at 150°C or hot fuel tests at 90°C mirror realistic situations during a vehicle’s life time. Data from these new test procedures is directly usable for all functional groups of a automotive electronics manufacturer from design to production and enables for shortened time of development and an earlier start of production.|
|Stefan Flick, Manager Technical Service Europe
W.C. Heraeus GmbH
Hanau D 61350,