Here is the abstract you requested from the CICMT_2007 technical program page. This is the original abstract submitted by the author. Any changes to the technical content of the final manuscript published by IMAPS or the presentation that is given during the event is done by the author, not IMAPS.
|Complex Permittivity Measurements at Millimeter Waves Frequencies|
|Keywords: complex permittivity, millimeter waves, Fabry Perot Resonators|
|Contemporary circuit designers are requiring larger bandwidths from microsystems to accommodate the ever-increasing demand for denser content. The performance of these microsystems is intrinsically related to the complex permittivity of the substrate material used, especially at millimeter wave frequencies. One of the most accurate methods of measuring the substrate’s permittivity at these frequencies is with a Fabry Perot Resonator (FPR). This paper will present a brief overview of the theory and operation of FPRs, and will describe how these resonators can be used to measure the complex permittivity of various materials. Measurements of selected ceramic substrates at frequencies of 60 GHz and 100 GHz will also be included.|
|Bill Riddle, Electronics Engineer
National Institute of Standards and Technology