Micross

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Electric and Magnetic Scans of the Near Field of a PC Platform System Clock
Keywords: near fields, silicon, IC packages
This paper describes a set of near field scans performed over the surface of a Pentium 4 class system clock. The scans were performed with electric and magnetic probes at a distance of 500 microns from the surface of the package and the silicon. The paper is divided into three sections; the first section describes results when the entire package is considered; the second part describes fine scale measurements, with a spatial resolution of 100 microns, performed over the silicon alone; the last section describes wide band measurements performed using a GTEM and relates the near field measurements to GTEM.
Kevin Slattery, Engineering Research Manager
Intel
Hillsboro, OR
USA


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