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Abstract Preview
Here is the abstract you requested from the IMAPS_2007 technical program page. This is the original abstract submitted by the author. Any changes to the technical content of the final manuscript published by IMAPS or the presentation that is given during the event is done by the author, not IMAPS.
| Electric and Magnetic Scans of the Near Field of a PC Platform System Clock |
| Keywords: near fields, silicon, IC packages |
| This paper describes a set of near field scans performed over the surface of a Pentium 4 class system clock. The scans were performed with electric and magnetic probes at a distance of 500 microns from the surface of the package and the silicon. The paper is divided into three sections; the first section describes results when the entire package is considered; the second part describes fine scale measurements, with a spatial resolution of 100 microns, performed over the silicon alone; the last section describes wide band measurements performed using a GTEM and relates the near field measurements to GTEM. |
Kevin Slattery, Engineering Research Manager
Intel
Hillsboro, OR
USA |
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