Here is the abstract you requested from the IMAPS_2007 technical program page. This is the original abstract submitted by the author. Any changes to the technical content of the final manuscript published by IMAPS or the presentation that is given during the event is done by the author, not IMAPS.
|The Interactions of Geometric Periodicity and Lattice Mismatch on the Electromechanical Response of Piezoelectric Thin Films|
|Keywords: piezoelectric thin films, periodicity, lattice mismatch|
|The electromechanical response of piezoelectric thin films deposited on substrates is noticeably diminished compared to the response of free standing films. Among several reasons responsible for such degradation is the elasticity of the substrate as well as lattice mismatch effects. This paper will report a finite element study of the converse and direct piezoresponse of a Barium Titanate (BaTiO3) periodically deposited thin films on a Magnesium Oxide (MgO) substrate. The effect of internal stress is proposed to be captured by the use of an ¡§effective¡¨ internal stress parameter. Specifically, the interactions of geometric periodicity with lattice mismatch and their resulting effects on the converse and direct response are studied. A special focus is the role of geometric periodicity in mitigating the degradation in the electromechanical properties of the deposited thin films.|
|B. Liu, Research Assistant
University of Arkansas at Little Rock
Little Rock, AR