Abstract Preview

Here is the abstract you requested from the IMAPS_2008d technical program page. This is the original abstract submitted by the author. Any changes to the technical content of the final manuscript published by IMAPS or the presentation that is given during the event is done by the author, not IMAPS.

Hybrid CSP Package: Challenges and Solutions in Design and Manufacturing
Keywords: Hybrid, 3D, High-density
The introduction of CSP hybrid package, where a wire bond die is stacked on a flip chip die, enabled the industry to integrate memory and ASICs in a smaller form and fit package compared to other 3D packages like stacked wirebond package or package-on-package. However, the process of making such a structure using conventional design rules and conventional processes like underfill (UF) and transfer mold limits the application to less complicated circuit interconnection with fewer I/Os, thus making it less appealing to the industry. This paper will discuss the challenges in making a high density Hybrid package and eventually the solution starting from design, such as substrate routing and bump design, to the assembly processes with detailed qualification and reliability test result.
Roden Topacio, Member of Technical Staff

  • Amkor
  • ASE
  • Canon
  • EMD Performance Materials
  • Honeywell
  • Indium
  • Kester
  • Kyocera America
  • Master Bond
  • Micro Systems Technologies
  • MRSI
  • Palomar
  • Plexus
  • Promex
  • Qualcomm
  • Quik-Pak
  • Raytheon
  • Specialty Coating Systems