Here is the abstract you requested from the IMAPS_2008 technical program page. This is the original abstract submitted by the author. Any changes to the technical content of the final manuscript published by IMAPS or the presentation that is given during the event is done by the author, not IMAPS.
|Automatic Optical Inspection of Ceramic Thick Film, Thin Film Hybrids and LTCCs|
|Keywords: Automated Optical Inspection, Thick Film Hybrid, LTCC|
|Automatic Optical Inspection (AOI) is becoming a very important aspect in the production of hybrids and LTCC. The substrate size of hybrids and LTCC is getting bigger and, at the same time, the structures of the layers and defect sizes are getting smaller. Therefore visual inspection is getting more and more time-consuming and unreliable. Transmission, reflection and absorption of materials are dependent on the wavelength of the incoming light. Therefore different materials require different lighting solutions in order to highlight all defects. The presented patented AOI technique uses multiple lighting solutions from UV to IR which can also be combined if needed to meet the requirements. But not only is the wavelength of the lighting critical, the structure of it is just as important. Inspection of highly reflective material like wet print needs a different approach than dry print. An extremely inhomogeneous reflective material like the polycrystalline silicon of solar cells requires a different structured light than a textured silicon surface. A fast area-scan camera is used which acquires images on the fly reducing inspection time and keeping up with increasing production rates. Sophisticated image processing software delivers repeatable results and helps to find production errors. This work presents various defects on different materials and their detection with a patented AOI technique which is reliable and highly flexible.|