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Accelerated Degradation Test under Multiple Environmental Stresses and Reliability Estimation for Circular Electrical Connectors
Keywords: electrical connector, reliability estimation, accelerated degradation test
The circular electrical connector was widely used in aviation, aerospace and military system applications. Under such working or reserving conditions, contact failure was the most prevalent failure mechanism of electrical connectors. But only a few tests especially multiple stresses tests and physical of failure (PoF) modeling study was conducted on this type of electrical connectors. This paper addresses some concerns related to the last application of modeling, estimation of electrical connectors¡¯ reliability. A combined laboratory accelerated degradation testing and PoF modeling approach to estimating connector reliability will be proposed. Firstly, temperature, random vibration and current stress were selected as acceleration factors that all the main environmental and electrical factors affecting the contact life of electrical connectors. An application-specific failure criterion for contact resistance degradation is also determined. Secondly, an appropriate multiple stresses accelerated test scheme was derived by uniformly orthogonal design theory with reduced sample number and shortened test time. The PoF model for electrical connectors under multiple stresses yielded the generalized Eyring relationship. According to the system reliability model for multi-position connectors, connectors¡¯ life follows Weibull distribution, which is derived from extreme-value distribution theory. Through accelerated life test and data statistical analysis yielded the estimated value of reliability character of MIL-C-38999 I series electrical connectors under the action of temperature, vibration and current stresses. Finally, Scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS) surface analysis were performed to determine the failure phenomena after exposure to environmental conditions. The Eyring-Weilbull model was verified and can be used to estimate connector reliability.
Bo Sun,
Beijing University of Aeronautics and Astronautics (BUAA)
Haidian, Beijing 100083,
China


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