Here is the abstract you requested from the IMAPS_2008 technical program page. This is the original abstract submitted by the author. Any changes to the technical content of the final manuscript published by IMAPS or the presentation that is given during the event is done by the author, not IMAPS.
|ESD Solutions for a Class Zero Facility|
|Keywords: Electrostatic Discharge (ESD), Events, Latent|
|Expensive electronic components, used to protect the warfighter, are susceptible to ESD damage. Protection from such damage is largely attributable to possessing an understanding of the product susceptibility thresholds, and putting robust, cost effective solutions in place to be competitive in today’s market. Case-study test results indicated a Charged-Device Model event risk where robust Human Body Model protection processes were in place. A review of this study will include discussion of some of the newer ESD event detection equipment and techniques used to determine areas in need of attention. Proper use of this equipment aids in characterizing material properties such as surface resistance and tribocharging. Understanding the risks and correcting issues cost effectively in a class 0 facility are discussed in detail. Implementation of safeguards and employee education increases yields and decreases field returns by eliminating latent defects. Examples will be reviewed, and data provided, which support the paradigm that an in depth understanding of product design, material selection and work environment are key contributors to robust ESD protection.|
|Kevin Ouellette, Principal Engineer