Here is the abstract you requested from the IMAPS_2008f technical program page. This is the original abstract submitted by the author. Any changes to the technical content of the final manuscript published by IMAPS or the presentation that is given during the event is done by the author, not IMAPS.
|Reliability of Embedded Large-Area High-K Dielectric Capacitors in LTCC Substrates|
|Keywords: Reliability, Embedded, Capacitors|
|LTCC (Low-Temperature Co-fired Ceramic) offers certain advantages that make it an attractive alternative for automotive electronics applications. LTCC substrates offer high density features such as integral interconnect, backside printed resistors and embedded components all of which allow the substrate to shrink in overall size. Traditionally, high tolerance resistors and small (pico-farad) type capacitors were the only components that were considered for embedding into LTCC substrates. However, many automotive products require multiple high-tolerance capacitors, as large as 10,000 pF that could be embedded, if a high-k dielectric could be successfully utilized. This paper summarizes the results of a study designed to evaluate the reliability of large-area (up to 0.250 in2) embedded capacitors into LTCC substrates using a high-k barium titanate thick-film dielectric paste developed by DuPont. This project involved the design, fabrication and electrical evaluation of LTCC embedded capacitor test boards capable of accommodating twelve large-area embedded capacitors. The embedded capacitors were designed to maximize the overall single-layer dielectric capacitance value for a given substrate area. Three different single dielectric layer capacitors were designed 0.0625, 0.141 and 0.250 in2 to be embedded within an eight layer 5|
|M. Ray Fairchild, Staff Development Engineer
Delphi Electronics and Safety