Here is the abstract you requested from the HiTEN_2009 technical program page. This is the original abstract submitted by the author. Any changes to the technical content of the final manuscript published by IMAPS or the presentation that is given during the event is done by the author, not IMAPS.
|Robust BME Class-I Ceramic Capacitors for High Temperature Applications|
|Keywords: High Temperature , Capacitor, BME C0G MLCC|
|For applications at temperatures of 150 degree C or above, such as in automotive under the hood electronics and power electronics, a robust dielectric material is necessary. In traditional X8R products (EIA specification, Delta C/C within +/-15% between -55 degree C and 150 degree C compared that at 25 degree C), the dielectric material is designed for applications up to 150 degree C. However, at temperatures above 150 degree C, these typically suffer from degradation of reliability performance and severe reduction in capacitance, especially under DC bias conditions. Recently, a Class-I C0G dielectric has been developed using Nickel electrodes for high temperature application up to 200 degree C. Due to its linear dielectric nature, this material exhibits highly stable capacitance as a function of temperature and voltage. MLCCs made from this material can be qualified as X9G with robust reliability. This paper will report electrical properties and reliability test data on these Class-I C0G ceramic capacitors at temperatures above 150 degree C. In addition, test data from D-E curves and energy density measurements will be reported along with a discussion of possible mechanisms behind the robust reliability of this material.|
|Xilin Xu, Technical Associate
KEMET Electronics Corporation