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Product Test Results of the HTADC12 12 Bit Analog to Digital Converter at 250C
Keywords: Analog to Digital Converter, 12 Bit, Test Results
This paper discusses the results of leveraging advances in high temperature electronics and integrating them for new applications and improved system performance. It centers around the development of the 250C High Temperature (HT) SOI CMOS process technology and its application to a Analog To Digital Converter (ADC) Integrated Circuit (IC). Honeywell has completed the development of a 12 bit Successive Approximation ADC for sensor data processing and control applications in extreme environments ranging from below -55C to 250C. Technology Development and Application The 12-bit ADC applies new technology and techniques derived from the high-temperature wafer process and design platforms developed under the U.S. Dept. of Energy DeepTrek program. It is a key component for high temperature conversion of analog sensor and control signals to digital data to create smart sensors. Specific aspects of the development will include: Transistor modeling for highly linear analog requirements Ability to control resistor and cap performance over wide temp range Minimize leakage through transistor balancing Balanced circuit design to temperature compensate the performance Wafer Level Trimming Early prototype results and optimization techniques Flexible digital interface: format and speed Test Results The test results of the HTADC12 will be compared to the design goals. Performance of both the digital and analog portions of the chip will be shown as well as the challenges encountered and overcome. The main parameters compared will be: Individual component performance Integral Non-Linearity (INL) Differential Non-Linearity (DNL) Power Consumption Digital interface Manufacturing process The 12 bit ADC will greatly expand the capability and performance of high temperature sensor based systems.
Thomas Romanko, Applications Engineer
Honeywell
Plymouth, MN


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