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|Evaluation of an SOI Operational Amplifier with High Temperature Packaging|
|Keywords: SOI, OPAMP, packaging|
|The maximum operating temperature specified by manufacturers of commercial silicon-on-insulator (SOI) devices/circuits with conventional packaging is usually 225C. It is important to understand the performance and de-rating of these SOI circuits at temperatures above 225C without the temperature limit imposed by commercial packaging technology. Previously, we reported test results of a low frequency square-wave oscillator based on an SOI 555 Timer with a special high temperature ceramic packaging technology from room temperature to 375C. In this paper, we report the testing results of unity-gain amplifiers based on a SOI quad operational amplifier (OPAMP) chip with high temperature packaging that enabled the testing at temperatures significantly above 225C. The SOI quad OPAMP die was attached to a 96% aluminum oxide substrate with high temperature durable gold (Au) thick-film metallization, and interconnected with Au wires. The SOI OPAMP die was soaked in a table-top box oven while all the discrete passive components were at room temperature during the testing. The alternative current (AC) parameters such as frequency response and rise times of the amplifiers, as well as direct current (DC) parameters such as total current and output offsets were measured as functions of temperature. The amplifiers were stable in AC mode up to 375C, while considerable DC offsets were observed at temperatures above 300C. The total DC current at ± 5 V increased from 1.5 mA at room temperature to 4.0 mA at 375C. These results indicate that the SOI OPAMP chip with high temperature packaging may operate for short term with appropriate de-rating at temperatures significantly above the current commercial SOI specification (225C). At the time this abstract is submitted, all four amplifiers have already operated at 375C for over 500 hours, and the test will continue until more significant failure is observed.|
|Liang-Yu Chen, Senior Scientist
OAI/NASA Glenn Research Center