Here is the abstract you requested from the Printed_2009 technical program page. This is the original abstract submitted by the author. Any changes to the technical content of the final manuscript published by IMAPS or the presentation that is given during the event is done by the author, not IMAPS.
|In Line Process Control and Yield Improvement for Printed Electronics|
|Keywords: Printed electronics, Inspection, optical defect scanning|
|Dr. Robert Bishop, President