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Evaluation of Glass Frits for Development of Lead-Free Thick Film Resistor
Keywords: Lead-free, Resistor, Thick film
This work develped a RuO2 based thick film resistor compatible with standard thick film firing. Thirty three commercially available glasses were evaluated for fired microstructure,wetting and CTE match. DSC/ TGA and SEM/EDS analysis was perfromed to determine composition and reaction endo/exotherms. Two glasses were selected and a RuO2 resistor system developed. X-ray diffraction on sapphire substrate (to minimize any interference from diffraction peaks of the alumina substrate) were perfromed to evaluate the glass-RuO2 interactions. A lead-free ruthenium oxide based resistor system was developed that could be fired with a standard thick film firing profile, formulations that covered a range from 400 ohms/sq. to 0.4 Mohms/sq with a TCR in the +- 350 ppm/deg. C .
W. Kinzy Jones, Sr., Professor
Florida International University
Miami, FL
USA


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