Here is the abstract you requested from the MIL_2010 technical program page. This is the original abstract submitted by the author. Any changes to the technical content of the final manuscript published by IMAPS or the presentation that is given during the event is done by the author, not IMAPS.
|Minimizing the Risk of Counterfeit Electronic Devices|
|Keywords: Counterfeit Parts, Electronic Devices, IC Manufacturers|
|Integra Technologies has had over 25 years experience testing and qualifying Integrated Circuit components both for IC manufacturers and users of the devices. In recent years there has been a dramatic increase in the occurrence of counterfeit components creating a need for an efficient method to detect them. The presentation will describe methods of detecting counterfeit parts and will use actual examples and experiences with counterfeit parts. Cost effective methods of test will be shown that can provide a reasonably high assurance of detecting counterfeit parts. Also covered will be different types of counterfeit devices and the test methods required to detect them. Finally some discussion will be included on problems with broker directed component screening.|
|Mark Marshall, VP Engineering
Integra Technologies LLC