Here is the abstract you requested from the DPC_2011 technical program page. This is the original abstract submitted by the author. Any changes to the technical content of the final manuscript published by IMAPS or the presentation that is given during the event is done by the author, not IMAPS.
|A New Robust One-Shot Switch for High-Power Pulse Applications|
|Keywords: high voltage switch, high speed, low turn on voltage|
|High Voltage (HV) switches capable of operating at high speeds and over a wide range of voltages and energies are used in a variety of pulse power applications in material science and plasma physics. Of particular interest is the use of small-scale capacitor discharges to measure the electrical properties of materials as they are heated from solid through liquid to a gas phase. In a capacitive discharge unit (CDU), energy stored in a capacitor is coupled through a switch into a low-impedance transmission line, which typically terminates with a thin sample of material. The energy coupled to the sample is sufficient to cause vaporization. Voltages in such systems range from a few volts to thousands of volts. These vaporized materials are used either as plasma sources for physics experiments, or to propel a thin layer of electrically insulating polymer for high-pressure-impact studies. Several types of switches have been used to drive these systems, including triggered spark gap, dielectric breakdown, and mercury vapor switches. A wide variety of solid-state devices, such as the insulated gate bipolar transistors, are also being utilized for these applications. Inducing a high-pressure shock wave in a dielectric to produce a transition from dielectric to conductor has also been used as an efficient single-shot switch for capacitor discharges. The high-voltage micro-machined switch presented in this document has been designed as a single-use alternative to the more expensive triggered spark gaps and solid-stage devices. The plasma-bridge switch is intended for large-volume, relatively inexpensive systems, and a cost-effective switch for use in destructive testing.|
|Thomas A. Baginski, Professor