Here is the abstract you requested from the HiTEN_2011 technical program page. This is the original abstract submitted by the author. Any changes to the technical content of the final manuscript published by IMAPS or the presentation that is given during the event is done by the author, not IMAPS.
|High Temperature Performance of Oxide Film Capacitors|
|Keywords: high temperature , electronics, capacitors|
|Film capacitors that perform well at temperatures exceeding 200°C, while retaining self-healing properties (i.e. â€śgracefulâ€ť or â€śbenignâ€ť failure) and with energy densities in excess of 1 J/cm3 are an enabling technology for many applications in automotive, geophysical exploration, aerospace, and the military. To address this need Faradox Energy Storage, Inc. has produced and is testing temperature-stable film capacitors fabricated using amorphous oxides as the dielectric material. The capacitors are made by depositing thin films of an oxide dielectric on both sides of a metalized polyimide substrate to form dielectric-coated electrodes. Currently Faradox is producing 2â€ť long, 1/4â€ť diameter 2 uF, 100 VDC capacitors. In this paper we present test data demonstrating that oxide film capacitors have relatively stable properties over a wide temperature range and retain excellent self-healing properties. Measurements include 4 sets of capacitors tested by different 3rd Party test facilities using a variety of test conditions including: â€˘ Life testing at 250°C for over 1000 hours with measurements of capacitance, leakage, dF and ESR. â€˘ Capacitance versus voltage, temperature and frequency â€˘ Impedance, ESR, and dF versus frequency and temperature and voltage Data will also be presented showing that the effective energy density of oxide film capacitors compares favorably with state-of-the art high temperature ceramic capacitors. This work was partially supported by DOE grant DE-FG02-08ER85203.|
|Keith D. Jamison, CEO
Faradox Energy Storage, Inc.