Here is the abstract you requested from the HiTEN_2011 technical program page. This is the original abstract submitted by the author. Any changes to the technical content of the final manuscript published by IMAPS or the presentation that is given during the event is done by the author, not IMAPS.
|Ceramic Capacitors and Stacks for High Temperature Applications|
|Keywords: High Temperature, Ceramic Capacitor, C0G|
|There is a growing need for ceramic capacitors for applications at temperatures of 150°C or above, such as electronics for down-hole drilling, geothermal energy generation and power electronics. In traditional X8R ceramic capacitors (EIA specification, TCC or (deltaC)/C within ±15% between -55°C and +150°C compared that at 25°C), the dielectric material is designed for applications up to 150°C. However, at temperatures above 150°C, the X8R capacitors typically suffer from degradation of reliability performance and severe reduction in capacitance, especially under DC bias conditions. Recently, a Class-I C0G dielectric has been developed using Nickel electrodes for high temperature application up to 200°C and beyond. Due to its linear dielectric nature, this material exhibits highly stable capacitance as a function of temperature and voltage. Multi-layer ceramic capacitors (MLCC) made from this material can be qualified as X9G with robust reliability. This paper will report electrical properties and reliability test data on these Class-I C0G ceramic capacitors at high temperatures at 150-200°C and above. In addition, reliability and other test data on ceramic stacks using this dielectric will be reported along with a discussion of possible mechanisms behind the robust reliability of this high temperature dielectric.|
|Abhijit Gurav, Senior Director, Ceramic Innovation Center
KEMET Electronics Corporation