Here is the abstract you requested from the IMAPS_2011 technical program page. This is the original abstract submitted by the author. Any changes to the technical content of the final manuscript published by IMAPS or the presentation that is given during the event is done by the author, not IMAPS.
|Investigating Stress in Hybrid Electronics Packages Using White Light Surface Profilometry|
|Keywords: Hybrid Package, Stress, Optical Interferometry|
|Hybrid electronics packages are often used in space applications because of their rigidity, hermeticity, and good thermal dissipation properties. These properties make them highly reliable in the harsh space environment. However, a recent space application of hybrid electronics packages failed during testing. The failure was traced to cracks in the high temperature co-fired alumina ceramic substrates that resulted in the loss of electrical continuity in some packages. To investigate stress states and crack growth in the packages, a novel technique for stress determination using optical surface profilometry was developed. The technique employs a scanning white light surface profilometer to obtain topographical contour maps of the hybrid electronics packages. Surface curvature reveals the stress state of a component, which can affect its functionality. By comparing the topography during thermal cycling and de-processing of a fully assembled package, hypotheses regarding the build-up of stress can be investigated.|
The Aerospace Corporation
Los Angeles, CA