Here is the abstract you requested from the IMAPS_2011 technical program page. This is the original abstract submitted by the author. Any changes to the technical content of the final manuscript published by IMAPS or the presentation that is given during the event is done by the author, not IMAPS.
|MEMS Integrated Packaging for RF Circuit Testing and Self Calibration|
|Keywords: MEMS, RF Circuit Testing, Self Calibration|
|Today's integrated packaging consists of analog, mixed-signal and RF circuits. These integrated packages are now available in 3-D which makes it extremely difficult to test for defects and their circuit functionalities. This paper provides MEMS enhanced integrated packaging which provides self testing and calibrations to overcome process defects and out of spec circuits inside the package making the package self heal itself in case of faults and defects. We developed a novel multi-tone dither test technique where the test stimulus is generated by modulating the RF carrier signal with a multi-tone signal generated on an Arbitrary Waveform Generator (AWG) with additive white Gaussian noise. This test stimulus is provided at the input of the RF circuit and the peak-to-average ratio (PAR) is measured at the output. A look-up table has been generated with the circuit condition and the corresponding PAR values. For a faulty circuit, a significant difference is observed in the value of PAR when compared to a fault-free circuit. Simulation is performed for various circuit conditions such as fault-free as well as fault-induced and their corresponding PARs have been stored in the look-up table. Hardware testing is performed and the results are compared with the look-up table to verify if the device is fault-free. In faulty circuit conditions, calibration is performed using a tuning circuit which consists of MEMS switches. We have considered a low noise amplifier as the reference RF circuit which operates between 4 GHz and 6 GHz with a gain of approximately 30 db, noise figure of 0.916 db and stability factor of 1.025. Testing is performed on the LNA to validate its electrical performance. The entire validation of the design using test technique and self-calibration of the RF circuit is automated using the calibration algorithm. This testing and self-calibration technique is exhaustive and efficient for present-day communication systems.|
|Sukeshwar Kannan, Student
University of Alabama