Here is the abstract you requested from the MMC_2011 technical program page. This is the original abstract submitted by the author. Any changes to the technical content of the final manuscript published by IMAPS or the presentation that is given during the event is done by the author, not IMAPS.
|Package Reliability Testing Challenges and Trends|
|Keywords: Package, Reliability, Trends|
|Discussion of how the increase in complexity of reliability testing (over past 10 years) is driven by the increase in complexity of package architecture. Use of one example (drop shock testing) to demonstrate the evolution of reliability testing and the increase in testing complexity. Discussion of reliability test standards and how the progression of technology is challenging the ability for test standards to keep pace.|
|Mike Ferrara, Staff Reliability Engineer, Advanced Reliability Group