Abstract Preview

Here is the abstract you requested from the cicmt_2013 technical program page. This is the original abstract submitted by the author. Any changes to the technical content of the final manuscript published by IMAPS or the presentation that is given during the event is done by the author, not IMAPS.

0.84(K0.48Na0.52)NbO3-0.16K0.56Li0.38NbO3 lead-free piezoelectric ceramic prepared by multilayer ceramic process
Keywords: Lead-free piezoelectric ceramics, KNN, thick film
Multilayer ceramic process including tape casting, electrode printed, laminated and sintering process, is an important process to realize the multilayer structures. Piezoelectric ceramics are widely used in functional components and devices such as transducers, transformers, actuators, and sensors. The trend in device miniaturization and integration promotes the application of multilayer ceramic process in piezoelectric components. This work reported our most recent results in 0.84(K0.48Na0.52)NbO3-0.16K0.56Li0.38NbO3 lead-free piezoelectric ceramics prepared by multilayer ceramic process. Effects of sintering temperature and holding time on the crystal structure, density, microstructure, dielectric and piezoelectric properties of the ceramics were investigated. All the ceramics exhibit a coexistence of orthorhombic perovskite structure and tetragonal tungsten bronze structure. Ceramics sintered at 1050 ºC for 8 min exhibit the largest relative density up to 95% , and the best dielectric and piezoelectric properties: dielectric constant εr=618, dielectric loss tan=0.027 and piezoelectric constant d33=112 pC/N.
Zhiqiang Zhang,
Shanghai Institute of Ceramics, Chinese Academy of Sciences
Shanghai, Shanghai

  • Amkor
  • ASE
  • Canon
  • EMD Performance Materials
  • Honeywell
  • Indium
  • Kester
  • Kyocera America
  • Master Bond
  • Micro Systems Technologies
  • MRSI
  • Palomar
  • Plexus
  • Promex
  • Qualcomm
  • Quik-Pak
  • Raytheon
  • Specialty Coating Systems