Micross

Abstract Preview

Here is the abstract you requested from the cicmt_2014 technical program page. This is the original abstract submitted by the author. Any changes to the technical content of the final manuscript published by IMAPS or the presentation that is given during the event is done by the author, not IMAPS.

Dielectric Constant, Loss Tangent, and Surface-Roughness Loss Characterization of Ceramic Substrates
Keywords: high frequency characterization, dielectric constant, loss tangent
A simple method for dielectric constant characterization is the full sheet resonance method (IIPEC). In this technique, the dielectric constant is extracted from the resonance frequencies of a parallel-plate waveguide resonator. The standard method cannot be applied to extract the loss tangent. At the 2012 conference, a new method was introduced to extract the loss tangent as well (Engin, A. E. & Pasunoori, P.). The new method made use of a rapid plane solver and resonators with shorted boundaries. The materials properties were extracted by fitting the simulations to measurements by assuming known surface roughness variation. In this paper, for the first time we introduce a methodology to extract dielectric constant, loss tangent, and surface-roughness loss simultaneously. We apply the method on a ceramic substrate to extract these parameters as a function of frequency up to 20 GHz.
A. Ege Engin, Associate Professor
San Diego State University
San Diego, CA
USA


CORPORATE PREMIER MEMBERS
  • Amkor
  • ASE
  • Canon
  • EMD Performance Materials
  • Honeywell
  • Indium
  • Kester
  • Kyocera America
  • Master Bond
  • Micro Systems Technologies
  • MRSI
  • NGK NTK
  • Palomar
  • Plexus
  • Promex
  • Qualcomm
  • Quik-Pak
  • Raytheon
  • Specialty Coating Systems