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Lifetime and Failure Modes of High Temperature SOI Products
Keywords: Reliability, Silicon-on-Insulator, Failure Modes
RelChip has performed life test studies on its RAM and has shown that Silicon On Insulator (SOI) processing with Aluminum-Tungstun metal traces do not fail due to electromigration and can operate for over 4000 hours at 350C. Three parts were randomly selected and functionally tested at the extreme temperature using HAST. The parts were pulled periodically for in-depth testing and examination. Test results indicate failures are due to device failures, and not electromigration.
Derek Maxwell, QA Manager
RelChip
Sandy, UTAH
United States


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