Honeywell

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Predict SiC MOSFET Aging
Keywords: SiC MOSFET, Aging, MEA
More Electric Aircraft (MEA) has been a key initiative in Silicon Carbide (SiC) and Wide Band Gap device development, but SiC Device Long Life Time of 30-40 years has not been demonstrated yet. Let’s discuss together a predictive approach for SiC device aging detection. We believe the predictive approach method can enable faster adoption of SiC devices in Critical Mission Applications.
Laurent Martinez, Sales Manager
X-REL Semiconductor
Grenoble, Cedex
France


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