Here is the abstract you requested from the HITEC_2018 technical program page. This is the original abstract submitted by the author. Any changes to the technical content of the final manuscript published by IMAPS or the presentation that is given during the event is done by the author, not IMAPS.
|Predict SiC MOSFET Aging|
|Keywords: SiC MOSFET, Aging, MEA|
|More Electric Aircraft (MEA) has been a key initiative in Silicon Carbide (SiC) and Wide Band Gap device development, but SiC Device Long Life Time of 30-40 years has not been demonstrated yet. Let’s discuss together a predictive approach for SiC device aging detection. We believe the predictive approach method can enable faster adoption of SiC devices in Critical Mission Applications.|
|Laurent Martinez, Sales Manager