Honeywell

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Dielectric Constant and Loss Tangent Characterization of Alumina Substrate Using Cavity Resonators
Keywords: dielectric constant, alumina substrate, cavity resonators
As electronic packages adopt higher frequencies, particularly the higher frequency bands of 5G, the characterization of materials and substrates at multiple frequencies becomes essential. Extraction of the relative permittivity and loss tangent of a dielectric is a complex process. Methods have been proposed using split post resonators, split cylinder resonators, rectangular cavity resonators, or ring resonators. All of these methods have their own set of advantages and disadvantages. The approach in this paper looks at square cavity resonators of different sizes on a single test coupon. This method attains a high level of accuracy at multiple frequencies. In this case, the electric field is perpendicular to the dielectric. Measurements of a set of Alumina test coupons were taken on a performance network analyzer (PNA) and simulations of identical models were performed in both ANSYS HFSS and CST Studio. These measurements and simulations were analyzed, and the relative permittivity and loss tangent were extracted at multiple frequencies. There were a few challenges tackled during the extraction process. First, different simulators have different surface roughness modeling methodologies. Secondly, the extracted permittivity of the Alumina test coupons was very sensitive to the physical size of the manufactured cavities. Lastly, the extracted dielectric loss tangent was sensitive to the losses of the conductors during simulation. Future study will adopt the same method of extraction but using individual copper cups of different sizes, filled with an under-fill material to be characterized.
Robert B. Paul, Student
San Diego State University
San Diego, CA
USA


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