Metro Chapter

Region: 

Metropolitan New York/Long Island

Future Meeting Information

 

METRO Chapter

Dinner Presentation

 on Wednesday February 25, 2009

Wire Bonding Semiconductor Devices for Metallurgists

Featuring:

Lee Levine

Process Solutions Consulting

8009 George Road,

New Tripoli, Pa 18066

 

Program Info:

In 2008 more than 1013 semiconductor interconnects will be formed. Of this quantity, more than 90% will be produced by wire bonding. Wire bonding is a high speed, ultrasonic welding process. In the more common variation, ball bonding, fine diameter (average diameter is now < 25m m) gold or copper wire is welded to a thin (1m m) Al-1%Si-0.5%Cu bond pad on the semiconductor device. Typical bond pads are now < 75m m square and devices like graphic processors may have more than 1000 on a single device. State-of-the-art bonders now operate at rates > 16 wires/second (32 welds + high speed motions between the two welds that define each wire). Placement accuracy must be better than ± 2.5m m.

Yet for all that the wires are a small fraction of the diameter of a hair (100m m) and the speed is high, the process is a welding process and must be understood from a metallurgical perspective.

At the start of the process, formation of a ball on the tip of the wire by a spark from the Electronic Flame Off (EFO) is a melting/casting process. Thermal transfer to solidify the ball is >90% up the wire and the grains are clearly columnar, with a few equiaxed grains at the very bottom tip of the ball (the last region to solidify).

The influence of ultrasonics on metals has been shown to significantly change the physical properties, lowering the flow stress and Young’s Modulus, allowing both easy flow of slip planes with massive plastic deformation of the ball and also significant deformation of the underlying bond pad.

Gold bonding wire is normally 99.99% (4-9’s, 100 ppm total impurities) pure and is produced by refining gold to 5-9’s purity, and alloying within the 100ppm allowable impurity range. Absolute control of the alloying is required to allow the dynamics of high-speed loop formation (Z- axis accelerations of >300 g’s) without loss of control or damage to the wire.

Intermetallic formation in the Au-Al and Cu-Al systems has been widely studied and much work has gone into controlling distribution of phases.

The use of copper ball bonding is growing rapidly, especially in the larger wire diameter applications where the replacement of Au by Cu provides a large cost advantage. Copper has some advantages (cost, conductivity, stiffness) but it is also harder mechanically and can cause damage to the underlying Si, is more difficult to bond (the intermetallic has a much lower growth rate) and requires a reducing atmosphere to eliminate oxidation.

 

Speaker Bio:

 

Lee is a consultant for Process Solutions Consulting where he provides process engineering consultation and SEM/EDS analysis. Lee’s previous experience includes 20 years as Principal and Staff Metallurgical Process Engineer at Kulicke & Soffa and Distinguished Member of the Technical Staff at Agere Systems. He has been awarded 4 patents, published more than 50 technical papers, and in 1999 won the John A. Wagnon Technical Achievement award from the International Microelectronics and Packaging Society (IMAPs). Major innovations include copper ball bonding, loop shapes for thin, small outline packages (TSOP and TSSOP, and CSPs) and introduction of DOE and statistical techniques for understanding semiconductor assembly processes. He is an IMAPs Fellow, V.P of the Keystone Chapter, and V.P Technology for IMAPS. In addition he is a senior member of IEEE.

Lee is a graduate of Lehigh University, Bethlehem, Pa where he earned a degree in Metallurgy and Materials Engineering.

Logistics and Registration:

Holiday Inn Ronkonkoma – Click here for Directions

3845 Veterans Highway
Ronkonkoma, NY 11779
631-585-9500

 

Registration/Networking 5-6:30 PM

Dinner Buffet: 6:30-7:15 PM

Presentation: 7:15-8:15 PM

 

Price: Members: $25.00 if Pre-Registered by February 25, 2009. $50.00 after  February 25, 2009

Non-Members: $50.00 if Pre-Registered by February 25, 2009.     $75.00 After February 25, 2009

Student Members: Free if Pre-Registered by February 25, 2009.     $25.00 February 25, 2009

Due to the anticipated large turnout, we will be giving preference to members. Please provide your membership number when registering.

If you wish to join membership information is available at www.imaps.org

Pre Registration Email: metroimaps@optonline.net , Phone: Steve Lehnert (631) 379-8239

WEB: www.imaps.org/chapters/metro

 

 

Chapter Information

On December 4th METRO Chapter had a Holiday Party for members and guests. The event was well attended with all the guests commenting about what a great time they had. There were door prizes donated by Lyons and Associates, GSA Optimum, Q-Source and the Chapter itself. The highlight of the evening was when the chapter presented $1000.00 Scholarship awards to Tim Resig and Christian Grigoleit both charter members of the student Chapter at SUNY Farmingdale. The chapter would like to extend special thanks to Kevin Carmody and the staff of KC Party Entertainment for the donation of the DJ and equipment.

 

Continue to check back for more chapter information.

Chapter Officers

President:
Steve Lehnert
Space Systems Loral
Phone: 631 379 8239
Email: stevel43@optonline.net

Vice President:
Mike McKeown
Orthodyne
Phone: 516 739 2690
Email: Mike.McKeown@orthodyne.net

Technical:
Bob Conte
RSM Sensitron
Phone: 631 586 7600 x263
Email: Bob.Conte@rsm.com

Finance:
Scott Baldassarre
Miteq
Phone: 631 436 7400
Email: sbaldassarre@miteq.com

Arrangements:
Deirdre Kenny
FEI
Phone: 516-794-4500
Email: deirdrek@freqelec.com.