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Metro ChapterRegion: Metropolitan New York/Long Island
Future Meeting Information
Metro IMAPS Meeting Announcement When: Thursday March 27, 2008 Registration/Networking 5-6:30 PM Dinner Buffet: 6:30-7:15 PM Technical Presentation: 7:15-8:00 PM Where: Holiday Inn Ronkonkoma 3845 Veterans Highway Ronkonkoma, NY 11779 Ph: 631-585-9500 Price: Members: $30.00 if Pre-Registered Tuesday March 25, 2008 $35.00 After March 25, 2008 Non-Members: $35.00 if Pre-Registered by March 25, 2008 $40.00 After March 25, 2008 Student Members: $10.00 if Pre-Registered before March 25, 2008 $ 20.00 after March 25, 2008 Pre Registration Email: slehnert@imaps.org Phone: Steve Lehnert: (631) 345-3100 WEB: www.imaps.org/chapters/metro Embedded Discrete High K Capacitor Characterization in Low Temperature Co-Fired Ceramic (LTCC) Michael Skurski Dupont Michael A. Skurski is a Sr. Technical Service Representative with DuPont Microcircuit Materials, specializing in 951 Green Tape technology (LTCC), automotive defogger materials, Fodel(R) photoimaging, and Diffusion Patterning(tm) advanced patterning techniques, in addition to performing R&D related functions in these areas, and conventional thick This paper will discuss in detail the measurement results of the embedded discrete high K capacitors when fabricated within a Low Temperature Co-fired Ceramic (LTCC) structure. It will cover design rules and typical measured capacitor values and ranges which use high K thick film formulations of K ~500 and K ~1800 with X7R characteristics when embedded within the LTCC circuits. These capacitors could be utilized as biased and decoupling capacitors; near and around MMIC's and IC's instead of using surface mount capacitors or integrating them in the IC technology. Details of the properties of the dielectric materials, circuit functional designs and functional properties of the circuits will be discussed, along with processing details and recommendations. There are a limited number of vendor tables available for this meeting at a cost of $200.00 or 2 for 300.00. Please contact Steve Lehnert if you are interested. Chapter Information
METRO IMAPS is pleased to announce that it will be hosting a 3 day technical symposium and workshop on May 7, 8, & 9 2008 at the Holiday Inn Ronkonkoma Tentative Schedule May 7, 2008: A full day presentation on flip chip and chip on board technology Presented by Dr. Daniel Baldwin of Engent May 8, 2008: ˝ Day Symposium and Vendor Table Top Show May 9, 2008: A full day presentation on Hermeticity, Near Hermetic Packages and RGA. Presented by Tom Green of TJ Green Associates A full day presentation on Flip Chip and Chip on Board Technology presented by: Dr. Daniel F. Baldwin Founder of Engent Dr. Baldwin holds a Ph.D. and S.M., Mechanical Engineering: Massachusetts Institute of Technology B.S.E, Mechanical Engineering, Arizona State University § Keynote Address: “Visions of Electronics Manufacturing, Assembly, and Packaging,” EXPO 2000 World Exposition, Hanover, Germany
§ Board of Advisors, Association for Electronics Manufacturing, Society of Manufacturing Engineers (EM/SME)
§ Board of Directors, Surface Mount Technology Association (SMTA)
§ ASME, Outstanding Young Engineer Award, Electrical and Electronics Packaging Division
§ Outstanding Research Award, National Science Foundation, Packaging Research Center
Course fee: 500.00 IMAPS Member 600.00 Non Member (Includes Continental Breakfast and Lunch) Contact Steve Lehnert Phone (631) 345-3100 Email slehnert@imaps.org to register Time: 8:00 AM-4:30 PM Location: Holiday Inn Ronkonkoma 3845 Veterans Highway Ronkonkoma, NY 11779 Ph: 631-585-9500 On May 8, 2008
We will be holding a ˝ Day Symposium & Table Top Show at the Holiday Inn Ronkonkoma We are presently looking for Technical Presentations in the following Areas: Advanced Technologies, Quality & Reliability, Extreme Environments & Design, Thermal Design However all other subjects relating to the industry will be considered. Contact Bob Conte if you would like to present a paper. Phone: (631) 586-7600 x263 Email: Bob.Conte@rsm.com We have a limited number of vendor tables (Approximately 40) available on a first come first served basis. Cost 350.00 before 3/31/08 450.00 after (If any are still available) Contact Steve Lehnert for further information or to reserve a table. Phone (631) 345-3100 Email: slehnert@imaps.org We are considering a Golf outing on May 7, 8, or 9. Contact Mike McKeown if interested. Phone: (516) 739-2690 Email: Mike.McKeown@orthodyne.net
A full day presentation on: Hermeticity Testing , RGA and "Near Hermetic" Packaging Concepts A discussion of the new Hereticity requirements in Mil-Std 750 and potential impact in Mil-Std 883 will be included in this presentation : Hermeticity of electronics packages and hermeticity test techniques continue to be of critical importance to the microelectronics packaging community. Specifically, in the area of MEMS/MOEMS packaging, OLEDs, wafer scale packaging, optoelectronic devices and packaging for Military and Space. In addition, there are a host of medical implants, bio medical devices and emerging nanotechology applications that all require hermetic packages and valid techniques to measure the leak rate. In contrast to a hermetic cavity style package "near hermetic" packages are being developed that rely on polymeric materials, such as LCP, to make a package that provides just enough moisture protection to survive in the intended end user environment. This course begins with an overview of hermetic sealing processes. The class will then examine the accepted leak test techniques as prescribed in Mil Standard 883 Test Method 1014. This misunderstood test method is often a source of frustration. The basic science behind helium fine leak testing (both the fixed and flexible methods) will be presented. Difficulties and limitations in fine leak testing of small volume packages is a major industry concern, especially among the Space community. Issues with bomb times and pressures, measured leak rate vs air leak rates, “one way leakers”, virtual leakers will be addressed, along with gross leak testing; bubble, weight gain etc. In each case the focus will be on practical issues facing the industry. The latest techniques for measuring both gross and fine leak testing is Optical Leak Test (OLT). In this method a laser interferometer measures out of plane deflection on a lid surface in response to a changing pressure and relates these measurements to an equivalent helium leak rate. For some packages (e.g. MEMS and Opto devices) OLT is the only available viable technique. The ultimate goal is to seal the sensitive microelectronic component in a dry, inert atmosphere to allow reliable functioning of the device over it’s intended lifetime. The gas ambient inside the package is measured using Residual Gas Analysis. What is RGA (Residual Gas Analysis)? How does it relate to hermeticity testing? Is the current 5,000 PPM level valid for next generation MEMS/MOEMS and Nanotechnology. Besides moisture what other gases are of concern? Packages made from polymeric materials as opposed to traditional hermetic seals (i.e. metal, ceramic etc) require a different approach from a testing standpoint. The problem is now one of moisture diffusion through the barrier and package interfaces. A brief review of the techniques and methods to evaluate a "non-hermetic" approach is presented. In addition to a comprehensive set of course notes each student receives a copy of a "Practical Guide to TM 1014" authored by the Instructor. Who Should Attend This PDC is intended as an introductory to intermediate level course for process engineers, designers, quality engineers, and managers responsible for sealing, leak testing and RGA results and for those responsible for evaluating new cavity style packages. . Course fee: 500.00 IMAPS Member 600.00 Non Member (Includes Continental Breakfast and Lunch) Contact Steve Lehnert Phone (631) 345-3100 Email slehnert@imaps.org to register Time: 8:00 AM-4:30 PM Location: Holiday Inn Ronkonkoma 3845 Veterans Highway Ronkonkoma, NY 11779 Ph: 631-585-9500
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Chapter Officers President: Vice President: Technical: Finance: Arrangements:
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