WA1
High Heat Flux Management and Direct Die Attach Solder TIMS
Chair: Dave Saums, DS&A LLC 8 am - 9:25 am
Here we address some ways of handling the high CTE stress caused
by high heat FLUX.
Thermal Conductivity and Thermal Expansion of Functionally Engineered
Solders
Tony Ingham, Dave Kyaw, John Laughlin, Brian Lewis, Cookson Electronics
Sequential Deposition of Copper/Alumina Composites
Eugene A. Olevsky, X. Wang, J. Ma, A. Maximenko, San Diego State
University; M. Stern, B. M. Guenin, Sun Microsystems
Thermal Placement Design Optimization of Silicon Chip with Non-Uniform
Power Distribution using Genetic Algorithms
Teck Joo Goh, Intel Products (Shanghai) Ltd.; K. N. Seetharamu,
G. A. Quadir, Z. A. Zainal, Universiti Sains Malaysia
WA2 RF MEMS Packaging
Chair: David Galipeau, South Dakota State University 8 am - 9:25 am
RF MEMS is an important emerging technology. This session covers
several approaches for wafer level hermetic packaging of these
devices.
Wafer Level Hermetic Packaging for Above-IC RF MEMS: Process and
Characterization
Nicolas Sillon, P. Robert, E. Dahan, X. Baillin, C. Gillot, E.
Lagoutte, CEA-Leti
Localized Hermetic Micropackaging using Laser Sealing for RF Micro-electromechanical
Systems
Gustina Collins, Sanjay Raman, Guo-Quan Lu, Virginia Tech
A Universal Cost Effective Vacuum Chip-Scale Packaging for RF
MEMS
Guohong He, Barry Wissman, Jim MacDonald, Didier Lacroix, Discera
Inc.
WA3 3D Integration and Packaging I
Chair: Rajen Chanchani, Sandia National Laboratories 8 am - 9:25 am
The latest development, design and reliability issues in 3D die
stacking technologies will be presented in this session.
Flip-Chip-to-Wafer Stacking: Enabling Technology for Volume Production
of 3D System Integration on Wafer Level
Christoph Scheiring, Hannes Kostner, Datacon Semiconductor Equipment
GmbH; Paul Lindner, Stefan Pargfrieder, EV Group
Stacked Die Package Design Optimization
Tiao Zhou, Mark Gerber, Texas Instruments; Moody Dreiza, Amkor
Technologies
Evaluation on Die Cracking due to Handling Damage in FBGA DDP
for Memory Device using Handling Impact Test
Duk Yong Lee, Ho Jeong Moon, Shin Kim, Seung Woo Kim, Hee Kook
Choi, Samsung Electronics
WA4 PB Free Assembly II
Chair: Steve Adamson, Asymtek 8 am - 8:55 am
This session is centered upon the advances in aspects of Lead-free
assembly. The papers focus on the underfill for fine pitch small
diameter Pb-free CPSs, handling of heat sensitive components at
higher reflow temperatures and the impact of pad design and process
conditions on joint reliability. These too are all critical issues
in the implementation of Lead-Free solder assembly.
Lead-Free Assembly of Heat-Sensitive Components
Alan Rae, Cookson Electronics Inc.; Rahut Raul, Daryl Santos, SUNY
Binghamton
Lead-Free PCB Assembly and Effect of Process Conditions on Solder
Joint Profile and Reliability of Solder Joints
Periannan Arulvanan, Shi Xunqing, Singapore Institute of Manufacturing
Technology; Zhong Zhaowei, Nanyang Technological University
WA5 Thick Film & LTCC
Applications I
Chair: Roy Tom Coyle Jr., Northrop Grumman Space Technology 8 am - 9:25 am
Interconnect to mounted components and the advantages of embedding
those components. Core issues in this maturing technology.
Ball Shear vs. Wire Pull Testing Wire Bond Baseline Study on Two
Gold Thick Film Formulations
Luis Bravo, Collen Khalifa, Teledyne Electronic Technologies
LTCC Technologies for Harsh-Environment Automotive Applications
Utilizing Soldered Interconnections
Christopher Needes, Michael A. Smith, Mark A. Fahey, Patricia J.
Ollivier, DuPont; M. Ray Fairchild, Jerry L. Badgett, Carl W. Berlin,
John D. Myers, D.H.R. Sarma, Jiming Zhou, David W. Zimmerman, Delphi
Design of Integrated Inductances Based on Ferromagnetic LTCC-Layers
Robert Hahn, Stephan Schwerzel, Stefan Wagner, Grit Sommer, Fraunhofer
Institute for Reliability and Microintegration
WA6 - Special Session - FREE TO ALL GBC Business Spotlight Session
Chair: Paul Galletta, Teledyne Electronic Technologies 8:30 am - 9:30 am
This is a one hour session. Writing proposals is often frustrating
and time consuming. By following a few simple guidelines, you can
make the job easier for yourself and increase your chances of winning.
Tom Sant will identify the seven deadliest mistakes in proposal
writing and - more important - show you how to avoid them. He will
explain a four-step process for structuring your proposals that
will result in higher win ratios, how to use evidence to gain credibility,
and how to communicate a compelling value proposition.
Proposal Writing Session Leader – Tom Sant, Hyde Park Partners
Sant is the author of Persuasive Business Proposals, the
largest selling book on the subject, now in its second edition.
The American
Management Association has called him “America’s foremost
expert on proposal writing,” and SellingPower magazine named
him one of the “top ten sales trainers in the world.” This
one hour session will give an overview of the process of proposal
writing for all aspects associated with doing business within our
industry.
WA7 High Thermal Conductivity TIM and Die Attach Applications
Chair: Herb Dwyer, Consultant 10:20 am - 11:15 am
Listen to very advanced power die attach approaches, including
the use of nanomaterials.
Lead Free Die Mount Adhesive using Silver Nanoparticles Applied
to Power Discrete Package
Yasunari Ukita, Toshiba Corporation
Thermal Management of Very High Power Microwave Devices
Ray Fillion, David Shaddock, Laura Meyer, Jerome Garrett, Joshua
Wright, Peter Bronecke, General Electric Company
WA8 MEMS Packaging Processes
Chair: Janet Lumpp, University of Kentucky 10:20 am - 11:45 am
This session covers new processes for wafer level MEMS packaging
including flip-chip and solder.
Low Cost Hermetic Wafer-Level Packaging of Magnetic Proximity
MEMS Switches
Gordon Elger, Lior Shiv, Matthias Hesche, Hymite GmbH Berlin; Jean-Francois
Veneau, MEMScAP, S.A.; Konstantin Glukh, MEMScAP, Inc.
Flip-Chip Bonder for MEMS Assembly
Daniel N. Pascual, SUSS MicroTec
WA9 3D Integration and Packaging II
Chair: Rajen Chanchani, Sandia National Laboratories 10:20 am - 11:45 am
The latest development, design and reliability issues in 3D die
stacking technologies will be presented in this session.
Designing 3D Packages for High Performance
Vern Solberg, Tessera, Inc.
Ultra Dense Multichip Module Packaging Technology
Caroline Kondoleon, Thomas Marinis, Dariusz Pryputniewicz, Gary
Tepolt, Charles Stark Draper Laboratory
Advanced Packaging Technology - Reliability Report
Martin G. Sosa, Hytek Microsystems Inc.
WA10 PWB Fabrication
Chair: R. Wayne Johnson, Auburn University 10:20 am - 11:45 am
Some important issues in the manufacturing and reliability of
PWB.
Desmear Uniformity Technology in a Plasma Process
Lou Fierro, James Getty, March Plasma Systems
PTH Reliability Modeling with the Consideration of Manufacturing
Process
Jingsong Xie, Diganta Das, Michael Pecht, Kerry Eubanks, University
of Maryland
Advanced High Density Substrates Technology for 100 Micron Pitch
Flip Chip and Wafer Level Packaging
Fuhan Liu, Venky Sundaram, Ankur O. Aggarwal, George White, Rao
R. Tummala, Georgia Institute of Technology
WA11 Thick Film & LTCC
Applications II
Chair: John Menaugh, DuPont Microcircuit Materials 10:20 am - 11:45 am
Advanced techniques for stacked design, embedding components and
increasing connection reliability at low cost.
High Density Thick Film Substrates for Miniaturized 3D Chip Stacking
Packaging Solutions
John Crumpton, Robert Waldrop, Michael Skurski, DuPont; Mark Vandermeulen,
David Roy, Sam Pirritano, Thomas Bernacki, Ivo Koutsaroff, Charles
Divita, Sukhi Binapal, Gennum
Progress in the Integration
of Planar and 3D Coils on LTCC by using Photoimageable Inks
Rubén Perrone, Heiko Thust, Karl-Heinz Drüe, Ilmenau
Technical University
Materials and Processes for Plateable Conductors on LTCC
Patricia J. Ollivier, DuPont Microcircuit Materials; Mark Rine,
Spectronics Inc.
WP1 Interactive Forum (Poster Session)
Chair: Mike Ehlert, National Semiconductor LTCC Foundry 1 pm - 4 pm
One-on-one Interactive Forum. This is your chance for detailed
interaction with authors whose work is too good to miss.
Dot-to-Dot Maskless Bulk Interconnect Process for Stacked Chip
Packaging
William Hamburgen, Google
A New Ball Placement Approach for Maximizing Board Level Routability
of BGA Packages
Bhanu Jaiswal, Albert H. Titus, State University of New York at
Buffalo
Failure Analysis of Lead-Free Solder Joints for High-Density Packages
John H. Lau, Dongkai Shangguan, Todd Castello, Rob Horsley, Joe
Smetana, Walter Dauksher, Dave Love, Irv Menis, Bob Sullivan,
Agilent Technologies, Inc.
Electromigration Induced Stress Analysis using fully Coupled Mechanical
and Diffusion Finite Element Analysis with Non Linear Material
Properties
Minghui Lin, Cemal Basaran, State University of New York at Buffalo
Parasitics in Power Electronics Packaging
Didier Cottet, Amina Hamidi, ABB Switzerland, Coporate Research
A Novel Design Methodology for RF-Packages
Kazuhide Uriu, Toru Yamada, Masahiro Yamaoka, Matsushita Electric
Industrial Co., Ltd.
Development of Ultra-Thin Flip Chip Assemblies for Low Profile
SiP Applications
Charles Banda, Harry K. Charles, John S. Lehtonen, Allen C. Keeney,
Samuel F. Wilderson, Johns Hopkins University - Applied Physics
Lab.
Wafer-Level Packaging for RF Applications using High-Resistivity
Polycrystalline Silicon Substrate Technology
Alexander Polyakov, S.M. Sinaga, M. Bartek, J.N. Burghartz, Delft
University of Technology
Development of Plasma Metal Direct Bonding (P-MDB) by Surface
Activated Energy
Kazushi Higahi, Shinji Ishitani, Mathushita Electric Industrial
Co., Ltd.
A Performance Driven Bumping Solution for Automotive Power Devices
Thorsten Teutsch, PacTech USA - Packaging Technologies, Inc.; T.
Oppert, E. Zakel, Pac Tech – Packaging Technologies GmbH;
Mervi Paulasto-Kröckel, Motorola GmbH
Development of LTCC Post Fired Resistors for A6M/Gold Material
System
Michail Moroz, Ferro Electronic Material Systems
A Novel Layout Synthesis Algorithm of Embedded Passive Components
for RF Reliable System Design
Grit Sommer, Werner John, Herbert Reichl, Fraunhofer IZM
Reliability Analysis and Experimental Study on the Processing
and Interactions of Benzocyclobutene, Flux, and Underfill Materials
to Under Bump Metallurgy on Manufacturing of Advanced Flip Chip
HiCTE Packages
Surasit Chungpaiboonpatana, Mindspeed (Conexant) Inc.; Frank G.
Shi, University of California - Irvine
Wire-bonding-less Interconnection Technique for High Current Power
Modules
Shingo Sudo, Hiroaki Maeda, Satoshi Hirakawa, Tsuyoshi Takayama,
Atsushi Narazaki, Mitsubishi Electric
Development of Ultrasonic Flip-Chip-Bonding Interconnection Technologies
Naoki Sakota, Koki Kitaoka, Tomotoshi Satoh, Sharp Corporation
Thermal Stress Phenomena Induced into a Packaged Polymer AWG
Amelia G. Grobnic, Robert James, Claire Callender, Communications
Research Centre Canada
Packaging for Optical Rx/Tx Arrays: From BGA to CSP Packaging
François Marion, Julien Routin, CEA-LETI; Ronny Bockstaele,
Olivier Rits, IMEC
Reliability of SnAgCu Die Attach in Power Modules
F. P. McCluskey, YunQi Zheng, University of Maryland; Dan Huff,
Virginia Tech; Peter Hansen, John Jacobsen, Grundfos A/S - Denmark
An Optimal Design of the Chip-Stage for the use in the COF Packaging
Process
T.C. Hung, C.H. Chiu, I-Shou University
Build Up Organic Optical Platform for Wide Bandwidth Optical Links
by Integrated Optical Devices and Elements
Fuhan Liu, Daniel Guidotti, Zhaoran Wang, G.K. Chang, Rao R. Tummala,
Georgia Institute of Technology
Thick Film Based on ZnFe2O4+NiO+TiO2 Mixture as Propanol and Toluene
Gas Sensor
Khalil Arshak, I. Gaidan, University of Limerick
Application of using Photo-Sensitive Polyimide as Wafer Passivation
on 300mm Wafer Bump Process and Manufacturing Benefits of Flip
Chip Package
Rick Yu, Tom Tai, Mars Tsai, Advanced Semiconductor Engineering,
Inc. (ASE)
A Novel Three-Phase Motor Drive Utilizing Silicon on Insulator
(SOI) and Silicon-Carbide (SiC) Electronics for Extreme Environment
Operation in the Army Future Combat Systems (FCS)
Jared M. Hornberger, J. Hornberger, S. Magan Lal, A. B. Lostetter,
K. J. Olejniczak, and A. Mantooth, Arkansas Power Electronics International,
Inc.
Modeling and Design of Compact Multilayer LCP Filters for 802.11
WLAN Applications using Coupled Neural Networks and Genetic Algorithms
Rana Jitendra Pratap, Saikat Sarkar, Stephane Pinel, Joy Laskar,
Gary S. May, Georgia Institute of Technology
Nonlinear Finite Element Modeling and PWB Warpage Analysis of
Elastomeric Land Grid Array Connectors
Juan Cepeda-Rizo, Teradyne, Inc.; Hsien-Yang Yeh, California State
University; Nick Teneketges, Semiconductor Test Division, Teradyne,
Inc.
Optimization of 100 Micron Pitch Lead Free Solder Assembly Process
for High Reliability at 10ghz Signal Transmission
Ravi Doraiswami, Sandeep Sankararaman, Piyush Gupta, Woopoung Kim,
Raghav Madhavan, Zhuqing Zhang, Lianhua Fan, Venky Sundaram, Fuhan
Liu, Seyed Hosseini, Madhavan Swaminathan, C.P. Wong, Rao R. Tummala,
Georgia Institute of Technology
Thermal-Mechanical Degradation of Direct Chip Attach (DCA) to
IMS for Power Applications
Weidong Zhuang, Mark Cook, Grant Maloney, International Rectifier
Measuring and Modeling the Deformation of BGA Lead-free Solder
Joints under High Current Density
Hua Ye, Cemal Basaran, Douglas C. Hopkins, State University of
New York at Buffalo
WP2 Thermal Components and Low Resistance Package Development
Chair: Dave Saums, DS&A LLC 1:20 pm - 2:45 pm
Learn about two advanced packages and a novel cooling method here.
Thermal Characterization of Thermally Enhanced FBGA MCP
Joonghyun Baek, Sangwook Park, Samsung Electronics Co., Ltd.
High Performance Memory Module based on DDP
Sangwook Park, Joonghyun Baek, Haehyung Lee, Dongho Lee, Seyong
Oh, Samsung
Thermosyphon Cooling for Next Generation Microelectronics Using
High Conductivity Graphite Foam
Terry Tiegs, James Klett, Michael Trammell, Oak Ridge National
Laboratory
WP3 MEMS Packaging
Chair: Ryszard J. Pryputniewicz, Worcester Polytechnic Institute 1:20 pm - 2:45 pm
This session includes MEMS packaging solutions for automotive,
RF, and gyroscope applications.
MEMS Multichip Package Development for Automotive Applications
Tania Van Bever, Guy Brizar, AMI Semiconductor
Design, Material and Process Optimization to Enhance the RF MEMS
Switch Functionality
Ananda P. De Silva, Lianjun Liu, Henry Hughes, Motorola Semiconductor
Product Sector
Stress Minimization in Ceramic MEMS Gyroscope Packages
C. H. Yun, X. Zhang, J. Kuang, Y. Xu, J. A. Geen, P. W. Farrell,
Analog Devices Inc.
This session looks at new developments in the field of molding
compounds, including reliability, compatibility with lead-free
processes, and halogen-free systems.
Characterization of Poly Imide Passivation for Failure Mechanism
of Delamination in Packaging
KeunSoo Kim, Min Yoo, HeeYeoul Yoo, Amkor Technology - Korea
One Methodology for MSL1/260? Approaching in Lead Frame Based
Package
Jeffrey C. B. Lee, Advanced Semiconductor Engineering Inc.
Green Molding Compounds for JEDEC Level 1 Performance
Tanweer Ahsan, Henkel Corporation
RFID, textile and wearable electronics require new methods, materials
and concepts. This session features recent developments for the
next microelectronic revolution.
Conductive Adhesives for RFID Assembly: Low Temperature Snap Cure
Thermosets vs Thermoplastics
Chih-Min Cheng, Vito Buffa, Wanda O’Hara, Bo Xia, Emerson
and Cuming
Highly Conductive Printable Inks for Flexible and Low-Cost Circuitry
Paul Berry, Greg Butch, Marjorie Dwane, Dow Corning Corporation
Routing Methods Adapted to e-Textiles
Ivo Locher, Tuende Kirstein, Gerhard Troester, ETH Zurich
WP6 LTCC Advances
Chair: Roy Tom Coyle Jr., Northrop Grumman Space Technology 1:20 pm - 2:45 pm
Continued growth in new materials and methods for making ceramic
embedded passives along with new filter complex.
Process Issues and Effect of Process Variables on Electrical and
Mechanical Properties of Co-Fired LTCC Substrates
Chua Kai Meng, Periannan Arulvanan, Fan Wei, Vasudivan Sunappan,
Singapore Institute of Manufacturing Technology
Tape-on-Substrate Dielectric Technologies
Barry E. Taylor, Larry Bidwell, Rick Draudt, DuPont Microcircuit
Materials
Production Development of a Zero-Shrink LTCC Material System
Frans Lautzenhiser, Weiming Zhang, Samson Shahbazi, CTS Corporation
- Microwave Division
WP7 System Level Thermal Solutions
Chair: Douglas C. Hopkins, State University of New York at Buffalo 3:40 pm - 5:05 pm
Thermal analysis of systems in three critical designs are described
here.
Thermal Analysis of an Electronic Module with a Double-sided PCB
Housed in a 2-MCU Enclosure for Avionic Applications
Jonas Johansson, Ilja Belov, Kristina Säfsten, Peter Leisner,
Jönköping University - SaabTech AB
Advanced VLSI Packaging and Interconnect Solution for High Performance
Servers
Sam Dai, Hewlett Packard
A Study on the Thermal Problems of an Optical Pickup Actuator
Jung Eung Park, Hyo-Kune Hwang, Sam-Nyol Hong, Jin-woo Lee, Wae-yeul
Kim, LG Electronics Inc.
WP8 Hermetic and Near-hermetic MEMS Packaging
Chair: Ryszard J. Pryputniewicz, Worcester Polytechnic Institute 3:40 pm - 5:05 pm
Low cost packaging for optical MEMS, including HTTC and liquid
crystal polymers, is the focus of this session.
Multilayer HTCC Packaging for Spectral Biometric Sensors
Stephen P. Corcoran, Robert Rowe, Kristin Nixon, Lu Fan, Lumidigm,
Inc.
Near Hermetic Liquid Crystal Polymer Air Cavity Packaging
John W. Roman, RJR Polymers Inc.
Low Cost Air Cavity LCP (Liquid Crystal Polymer) Packaging
Michael A. Zimmerman, Quantum Leap Packaging, Inc.
WP9 Flip Chip Under Bump Metallurgy
Chair: Tim Lenihan, RVSI, Semiconductor Equipment Group 3:40 pm - 5:05 pm
The Flip Chip Under Bump Metallurgy (UBM) Session will cover topics
related to past, present and future issues in UBM like reliability,
geometry, low k dielectric and copper interconnect. Mechanisms
related to interfacial reactions and intermetallic growth issues
will also be covered. Finally, the affects of zincate in conjunction
with Ni plating in UBM will be reviewed for optimal strength and
reliability.
C4 Solder Bump UBM Reliability and Outlook
Jianxing Li, Mahalingam Sankararaman, Raymond Carey, Avi Fuerst,
William Johannes, Intel Corporation
Interfacial Reactions and Reliabilities of Pb-Free Solders on
Ni-xCu Alloy UBMs
Hun Han, T.Y. Lee, Jin Yu, KAIST
Effects of Under Bump Metallization on Solder Bump Reliability
Weimin Chen, J.F. Rohan, P. Byrne, P. McCloskey, S.C. O'Mathuna,
NMRC; P. J. McNally, L. O'Reilly, Research Institute for Networks
and Communications Engineering (RINCE)
WP10 PWB Thermal Design and Characteristics
Chair: R. Wayne Johnson, Auburn University 3:40 pm - 5:05 pm
Investigation of the effects of design parameters including vias
on the thermal and electrical performane of PWB.
Impact of Vias on Printed Circuit Board Performance
Dennis Lang, Chung-lin Wu, Fairchild Semiconductor
Coupled Thermal-Electric Analysis of Trace and Via Joule Heating
in Multilayer Structures
Mudasir Ahmad, Mason Hu, David Popovich, Cisco Systems Inc.
Optimal Design towards Enhancement of Board-Level Thermomechanical
Reliability of Bare-Die-Type Chip-Scale Packages
Yi-Shao Lai, Tong Hong Wang, Advanced Semiconductor Engineering,
Inc.
WP11 Microwaves & RF
Chairs: Peter Barnwell, Consultant & Aicha Elshabini, University
of Arkansas 3:40 pm - 5:05 pm
Microwave and RF technology are
continuing to expand and permeate through the market- place.
This session
will focus on Microwave & RF
Packaging including 1st level packaging and its applications.
Development of a Low Cost Millimeter-Wave BGA Package: Electrical
Design, RF Characterization, and EMI Analysis
Hongwei Liang, Joy Laskar, Texas Instruments Inc.
A Comparative Study of Compact Rectangular Microstrip Antenna
with Slots on Radiating Patch and Ground Plane
R. M. Vani, P.V. Hunagund, University Gulbarga - India; S.F. Farida,
University of Utah; K. Swathi, Osmania University - India
Broadband Leaded Transitions and a Narrow Band via Structure for
Multi-Layer Hermetic Packaging
Paul Garland, Gerardo Aguirre, Kyocera America, Inc.
WP12 - Special Session - FREE TO ALL Marketing Forum
Chairs: Michael O’Neill, Heraeus Inc. - Circuit Materials
Division; Howard Imhof, Metalor; John Voultos, DuPont Company 3:40 pm - 5:05 pm
The GBC (Global Business Council)
will offer a free-of-charge Marketing Forum to all IMAPS 2004
attendees who wish to participate.
IMAPS
- International Microelectronics And Packaging Society
611 2nd Street, NE -- Washington, DC 20002
imaps @ imaps.org | 202.548.4001