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Natel, Panasonic and Hesse & Knipps.

Professional Development Courses (PDCs)

All PDCs run 8:00 am - 5:00 pm, unless otherwise noted

Do you want to broaden and strengthen your skills and knowledge, optimize your manufacturing processes, and integrate the latest advances in materials and technologies to maintain your strength in today’s competitive global market? The Technical Committee of IMAPS is pleased to present a comprehensive offering of Professional Development Courses that provide detailed information on topics of immediate interest to the Microelectronics and Packaging community.  So please be sure to choose from the 18 in-depth Professional Development Courses taught by recognized industry experts.  You will discover the following key ways that will benefit you.

  • Better understand the skills and knowledge necessary in today’s industry.
  • Be exposed to the rapidly expanding developments in new materials and technologies.
  • Consult with renowned authorities about your current R&D or manufacturing problems and challenges.
  • Learn new ways to identify, think about, and address your problems and opportunities.
  • Great opportunities to interact with industry experts and other course attendees.
  • Certificate of Attendance and much more…

Your PDC Registration Fee Includes:

  • Lunch on the day of your course
  • Refreshment breaks
  • All course materials
  • PDC Reception on Sunday evening (for Attendees & Instructors only)
  • Certificate of Attendance

PDC Lunches and Reception sponsored by:Panasonic Factory Solutions - Premier Sponsor, Gold

PDC Cancellation policy:

IMAPS reserves the right to cancel a course if the number of attendees is not sufficient.  You can transfer to a different course or we will refund you the corresponding amount.

Sunday, November 2
Monday, November 3

S1: RF/Microwave Hybrids:
Basics, Materials and Processes


S3: Technology of Screen Printing

S4: Adhesion Fundamentals in
Microelectronic Packaging


S5: Advanced Packaging for
Higher Temperatures and Harsh
Environments


S6: Nanotechnology for Packaging: Materials, Processes,
Measurements and Applications

S7: Pre-Cap Visual Inspection
per Mil 883 TM 2017


S8 - ½ day: 8 am - Noon
Gas Analysis of Hermetically
Sealed Enclosures


S9 - ½ day: 1 pm - 5 pm
Packaging Issues & Solutions
for MEMS, MOEMS, and
Nanoelectronics

M1: Wire Bonding in
Microelectronics


M2: High-Performance Thermal
Management Materials


M3: Multilayer Co-fired Ceramics

M4: Hermeticity and “Near
Hermetic” Packaging Concepts


M5: Introduction to Microelectronics Packaging Technology
M6: Plating Processes for High
Reliability Microelectronic
Devices


M7: Failures and their Prevention
in Electronic Assemblies
with Focus on Lead (Pb) Free
Technology


M8 - ½ day: 8 am – Noon
Advances in 3D Integration
and Packaging


M9 - ½ day: 1 pm – 5 pm
Biomedical Materials, Devices
and Packaging

Sunday, November 2, 2008

S1
RF/Microwave Hybrids: Basics, Materials and Processes
Course Leader: Richard Brown, Richard Brown Associates

Course Description:
The demands for high frequency systems and products are rapidly growing, driven by wireless communication and automotive applications. New materials and technologies for hybrids are coupled to the continuing development of monolithic integrated circuits, MMICs.  Thus, system and product designers are faced with the choice between hybrids and MMICs; i.e., complete system on a chip vs. hybrids with discrete devices, or more often, somewhere in-between.  Smaller packages are tempered by the necessity for impedance matching, which defines transmission line geometries, as well as the need for overall low system losses.  Thus, the design and manufacture of high frequency circuits is governed by materials and process strategies.

This course begins with a short, non-mathematical review of high frequency basics.  Next a comparison of MMICs and hybrids is presented.  The transmission line as the basic circuit component of RF and microwave hybrids will be reviewed.  Hybrid “waveguide” structures will be compared as they relate to transmission line properties.  The basic materials (conductors, dielectrics and substrates) and their properties will be introduced.  Their effect on impedance, circuit properties and performance will be discussed.  Processing technologies and strategies suitable for RF/microwave hybrids will be reviewed.  Selected packaging protocols, such as vias and bonding wires, will be discussed in light of their influence on RF/microwave performance.  At the completion of this course, attendees will have a better understanding of many of the critical materials and processing factors affecting high frequency circuit performance.

Who Should Attend?
This introductory course will benefit those associated with the RF and microwave arena.  In particular this course will benefit those with responsibility for design and manufacturing of RF/microwave hybrids.  Supervisors, engineers and technicians involved in product development, design and manufacture are encouraged to attend.

Special Course Materials:
All attendees will receive a complimentary copy of RF/Microwave Hybrids: Basics, Materials and Processes, by Richard Brown, Springer Publishers, 2003 (List Price $195).

Richard Brown is a technical and engineering consultant in hybrids, with more than 30 years experience, encompassing thin and thick film, electroplating and substrate technologies.  He began his career at Bell Telephone Laboratories.  After joining RCA Solid State in 1968, he transferred in 1979 to the RCA Microwave Technology Center in Princeton.  In 1991, Mr. Brown joined an Alcoa Electronic Packaging technology team as program manager to implement thin film on high temperature co-fired ceramic for MCMs.  He has published extensively, authoring a chapter on Thin Film for Microwave Hybrids in “Handbook of Thin Film Technology,” McGraw-Hill, NY, 1998, A. Elshabini-Riad and F. D. Barlow III, Eds.  In 1995, ISHM awarded him the prestigious John A. Wagnon, Jr. Technical Achievement Award.  His text, “Materials and Processes for Microwave Hybrids” was published in 1991 by ISHM, Reston, VA., and most recently, RF/Microwave Hybrids; Basics, Materials and Processes, Kluwer Academic Press, 2002.

S2
Electronics Reliability – A Practical Overview CANCELLED
Course Leader: Andrew D. Kostic, Ph.D., The Aerospace Corporation

 

S3
Technology of Screen Printing
Course Leaders: Art Dobie, Sefar Printing Solutions & David Malanga, Heraeus Inc. - Thick Film Materials Division

Course Description:
Screen printing continues to offer innovative and cost-effective solutions to the increasing demands for higher circuit densities. This course is intended to increase the understanding of the screen printing process, thereby improving production yield and print quality.

Presented are some of the latest advancements in composition, screens, and printing technology that enable screen printing to meet future circuit density requirements as well as the definition required for microwave circuitry.  The advantages of screen printing, an additive deposition process, are described and compared to alternative more costly and “less-green” subtractive deposition technologies.

This course is applications-oriented in terms of how to optimize the screen printing process; how to use and specify screen correctly; rheology properties that affect print results; minimizing printing defects and trouble-shooting problems related to screens, inks and the printing process itself.

Who Should Attend?
This course is targeted for production and process engineers, plant and production managers and supervisors, and any others interested in learning how to optimize and increase the use of the screen printing process.

Art Dobie is Manager of Screen Technology for Sefar Printing Solutions, Inc. He has been with Sefar 27 years since receiving his BS in Screen Printing Technology in 1980 from California University of Pennsylvania.

Art is an invited instructor of the Screen Printing Technical Foundation’s Professional Screen Making Workshop, and has instructed IMAPS’ “Technology of Screen Printing” PDC since its inclusion in 1991.  He has delivered numerous technical presentations to screen-printing professionals at local, national and international level symposia.

Mr. Dobie is a Life Member and Fellow of the Society of IMAPS, and was the 2006 recipient of the IMAPS Technical Achievement Award for outstanding technical contributions to screen printing technology relating to microelectronics. In 1998, Art Dobie was inducted into the SGIA’s Academy of Screen Printing Technology.

David Malanga is currently the Worldwide Technical Service Manager for Thick Film Products at Heraeus Thick Film Materials Division in West Conshohocken, PA.  David has over 20 years of experience at Heraeus working in R&D, formulating thick film and LTCC materials, Technical Service solving processing and application problems directly with customers, and as manager of the Sales Department.  David has a B.S. and M.S. in Ceramic Science and Engineering from Rutgers University.  David has published various articles on thick film resistors, conductors, LTCC materials, and component metallizations worldwide.  He is a Life member and Fellow of the Society of IMAPS and has held both local and national positions in the organization.

S4
Adhesion Fundamentals in Microelectronic Packaging
Course Leader: R. A. Pearson, Ph.D., Lehigh University

Course Description:
Polymers are widely used in electronic packaging. The lack of adhesion can adversely affect reliability as well as package performance. The intention of this course is to review the fundamentals of adhesion and apply them to interfaces found in Plastic-Quad Flat Packs (PQFP), chip-scale packages (CSP), Flip-Chip (FC) assemblies, and optoelectronic packages. Adhesion issues in molding compounds, die attach adhesives, optoelectronic adhesives, and underfill resins will be covered.  Also, recent trends in using nanotechnology to toughen epoxy resins will be reviewed. By the end of the course, you should know how to choose the proper tools to predict and measure adhesion.

Course Outline:
1. Discuss Course Objectives
2. Review Microelectronic and Optoelectronic Packages (Brief)
3. Discuss the Role of Chemical Forces in Adhesion
4. Examine Extrinsic Deformation Mechanisms in Polymers
5. Review Common Tests to Assess Adhesion
6. Evaluate the Procedures Used to Form Adhesive Bonds
7. Apply Interfacial Fracture Toughness Concepts to Gage Reliability
8. Review the latest trends in epoxies containing nanosize fillers

Special Course Materials:
All attendees will receive a complimentary copy of Adhesives Technology for Electronics Applications: Materials, Processes, Reliability, by James J. Licari and Dale W. Swanson, William Andrew Inc., 2005 (List Price $180).

Who Should Attend?
Engineers, scientists and managers involved in the design, process and manufacturing of IC electronic components and hybrid packaging, electronic material suppliers involved in materials manufacturing and research & development.

Dr. Raymond A. Pearson joined the Materials Science and Engineering Department at Lehigh University in August of 1990 after obtaining his doctorate in Materials Science and Engineering from University of Michigan.  Prior to graduate school, Ray had worked for seven years with General Electric Company: from 1980-1984 as an associate staff member at GE’s Corporate Research and Development Center in Schenectady, New York and from 1984-1987 as a materials specialist at GEPE’s  Product Technology Center in Bergen op Zoom, the Netherlands.  His research interests include all aspects of processing, deformation, yield, and fracture of polymers.  He has worked extensively in the area of fracture mechanisms and adhesion. In 2001, Ray became Director of the Center for Polymer Science & Engineering. He has worked closely with organizations such as the Semiconductor Research Corporation and SEMATECH.

S5
Advanced Packaging for Higher Temperatures and Harsh Environments
Course Leader: Dr. Douglas C. Hopkins, IMAPS Fellow, University at Buffalo

Course Description:
Recently, advanced materials, such as conductive epoxies and adhesives or metal-bonded ceramics, allow unique packaging to increase density and improve thermal management in harsh environments. The use of SiC and GaN has fostered significant development in approaches that offer system operation to >200°C, or extended reliability at traditional temperatures.

The objective is to provide a packaging engineer with critical issues and design guidelines for higher temperature packaging approaches for levels 1-3 that directly influence the electrical, mechanical and thermal circuit design, performance and cost. Particularly, issues are addressed in design of high-density circuits and systems, including power-in-package, and integrated thermal management. Significant time is given to introducing recent results in electro- and thermo-migration modeling and testing of lead-free solders, and characterization of loaded composites. Aluminum-based packaging is discussed for higher power packaging to show advantages of using “near mono-material” metallurgical hierarchies to greatly increase reliability.

When finished, the attendee should be able to compare present and evolving packaging approaches; partition a circuit for optimum packaging technologies; and identify critical test parameters for manufacturing and test of systems for harsh environments.

Who Should Attend?
Engineers and mangers responsible for harsh-environment operation of electrical and physical circuit designs, which need to move to much higher thermal and packaging densities, or to improve reliability at much higher operating temperatures.

Dr. Hopkins is Research Professor at the University at Buffalo (SUNY), associate director of the UB Electronics Packaging Laboratory and director of the Electronic Power and Energy Research Lab, where he directs R&D in the physical integration of very high-density power electronic systems. He worked for GE’s and Carrier’s R&D Centers, and held visiting positions at several national labs.  He is an IEEE and IMAPS senior member. He is a founding member and now chair of the IMAPS Subcommittee on Power Packaging. He was Technical Chair of the International Workshop on Integrated Power Packaging 1998, and General Chair 2000, co-sponsored by IMAPS and IEEE. He has authored over 70 journal and conference publications, received three ISHM “Best Paper of Session” awards, and other awards.

S6
Nanotechnology for Packaging: Materials, Processes, Measurements and Applications
Course Leader: Ajay P. Malshe, Ph.D., FInstP, University of Arkansas; Co-founder and CTO of NanoMech LLC

Course Description:
This course will teach nanotechnology in the context of devices and packaging. Nanotechnology, science and engineering especially addresses: design, synthesis of nano materials (particles, molecules, quantum dots, etc.), assembly of nano elements into nanostructures, devices, and systems, and integration into larger scale structures (ex. microelectronics and microsystems) such that both heterogeneity and scalability are possible, tools and systems for reproducible nano manipulation and post-synthesis processing (self and/or directional), integration and packaging, addressing component reliability and system durability, and addressing “application specific” scientific and engineering designing-to-processing issues. The course will be taught in two sessions and will cover the following key topics:

·  Introduction to Nanotechnology
- What is nanotechnology?
- Applications of nanotechnology
- What is new about nanotechnology?
- Advantages of nanotechnology

·  Foundations of Nanotechnology
- Nanomaterials
- Nanodevices
- Nanofabrication
- Analytical tools for nanoscale analysis
- Fabrication laboratories (fablab) for nanotechnology

·  What is nanopackaging?
- Packaging of Microsystems vs. Nano Packaging
- Integration of nanomaterials in packaging
- Nanodevices and their packaging
- Changing paradigm of packaging
- Applications and market opportunities
- Introduction to environment and health aspects

Who Should Attend?
The course is specifically meant for industry and academic leaders and investors in science and engineering with interest in nano and nano-integrated micro systems.

Ajay P. Malshe (Ph.D., 1992; FInstP) is 21st Century Endowed Chair Professor at the Department of Mechanical Engineering and adjunct-faculty of Microelectronics and Photonics Program at the University of Arkansas. Malshe has multidisciplinary research programs in the fields of nanomanufacturing, IC, MEMS and micro and nano device packaging and integration, and surface engineering for advanced machining. He has authored over 135 peer reviewed publications, 4 book chapters, and holds 7 patents. He has graduated numerous students and post-docs. He has received 20 awards (1996-2006). He is also the Co-founder and Chief Technology Officer (CTO) of NanoMech LLC (www.nanomech.biz). NanoMech LLC is a nanotechnology innovations platform company with major current nanomanufacturing and product foci in four application sectors, Machining and Lubrication, Sustainable and Biocide Retail Packaging, Biomedical and Defense.

S7
Pre-Cap Visual Inspection per Mil 883 TM 2017
Course Leader: Thomas J. Green, TJ Green Associates LLC

Course Description:
The intent of this fast-paced one-day course is to give the student a good overview of the materials and processes used to assemble Hybrids/MCMs/RF Modules and review the associated visual inspection criteria.  The course begins with a review of important wafer fab steps (silicon and GaAs) and moves through thick and thin film substrate manufacturing, epoxy/solder die and substrate attach, ball and wedge wirebonding and finally hermetic seal. At each step of the way key processes are highlighted and the associated defects that result from improperly controlled processes, are looked at in detail (e.g., defective air bridges, excessive ball squash, too much epoxy etc.).  The instructor will share valuable lessons learned from real life experiences.  Hybrids all require a visual inspection step just prior to encapsulation or hermetic seal. This is a critical process step that requires a high degree of skill and understanding of what to look for and reject as part of the inspection process. This course defines the inspection criteria based on traditional Mil Spec documents in conjunction with industry accepted best commercial practices.  Over 150 color photographs of actual production defects are reviewed and discussed in detail.  The students are exposed to a variety of defects and how the defects relate to the materials and process flow. 

· Learn the basic materials and processes  used in the assembly of microelectronics and potential failure modes
· Understand how to interpret and apply Pre- Cap visual inspection criteria per Mil Std 883 TM 2017

Who Should Attend?         
This PDC is intended for inspectors, quality engineers, process engineers, designers, and even managers responsible for the quality and workmanship of high reliability military and space qualified microelectronics.

Thomas J. Green (www.tjgreenllc.com) is the Principal at TJ Green Associates LLC, a Veteran- owned small business devoted to providing world class teaching and consulting services in microelectronics packaging.    As an independent consultant, Tom’s been responsible for numerous successful projects in the area of wirebond, die attach and package seal and associated leak testing.   He designs curriculum and teaches industry short courses relating to advanced microelectronics manufacturing processes. He has over twenty- five years experience in the microelectronics industry at Lockheed Martin Astro Space and USAF Rome Laboratories. At Lockheed he was a Staff engineer responsible for the materials and manufacturing processes used in building custom high reliability space-qualified microcircuits (Hybrids, MCMs and RF modules) for military. Tom is an active member of IMAPS and a Fellow of the Society. He has a B.S. in Materials Engineering from Lehigh University and a Masters from the University of Utah.

S8 - ½ Day Course: 8:00 am - Noon
Gas Analysis of Hermetically Sealed Enclosures
Course Leader: Robert K. Lowry, Technical affiliate with Oneida Research Services and Consultant in Electronic Materials Analysis

Course Description:
To assure reliability of hermetic enclosures, it is crucial to know the chemical composition of their gas ambients, chemical species that threaten component reliability, and material/process factors essential for controlling these species. This course covers methods for analyzing gas composition of hermetic enclosures and associated reliability concerns.   

The course reviews high-profile microelectronic component failures of the 1970s caused by moisture in packages, the technical concerns that inspired creation of Test Method 1018, and factors that led to selecting 5000ppmv as the moisture limit. It covers failure mechanisms caused by moisture and other species within enclosures, including metallization corrosion, optoelectronics fogging, stiction, dendritic growth, device instability, solder cracking, etc.

The course describes three types of in-situ sensors and three methods of gas-phase chemical analysis, and reviews the quantitative and survey attributes of mass spectrometry suiting it uniquely to package gas analysis. It describes mass spectrometers configured for package gas analysis and focuses on data interpretation, including several case studies.

We explore laboratory correlation issues and recent measurement improvement studies, including DSCC round robins and a “consensus standard” single sample cylinder circulatable between laboratories for correlation studies. The course concludes with recommendations for materials handling and processing to control gases in sealed devices.

Who Should Attend?
Design, process, product, and quality/reliability engineers and managers who produce hermetic packages, and system engineers and managers who must assure hermetic product compliance to moisture limits.

Mr. Lowry is an electronic materials consultant, also affiliated with Oneida Research Services. After obtaining BS/MS degrees in Chemistry he worked for 32 years at Radiation, Inc., Harris Semiconductor, and Intersil Corp. He was responsible for materials analysis and was Senior Scientist in charge of Analytical Services at Harris and Intersil. He did failure analysis work on early moisture-related failures of NiCr and aluminum-metallized ICs. He patented a surface conductivity dewpoint sensor and helped draft Test Method 1018. He established a DSCC-suitable facility at Harris for statistical control of hermetic sealing capable of the moisture limit thereby assuring compliant product. He conducted extensive split-lot studies of correlations between two different mass spectrometers. He also helped characterize a “consensus standard” circulatable single sample cylinder using humidified air to improve correlation between laboratories.

S9 - ½ Day Course: 1:00 pm - 5:00 pm
Packaging Issues & Solutions for MEMS, MOEMS, and Nanoelectronics
Course Leader: Dr. Ken Gilleo, ET-Trends LLC

Course Description:
This new course provides an overview of MEMS (Micro-Electro-Mechanical Systems), MOEMS (aka; Optical-MEMS) and Nanotechnology packaging strategies and technologies. Topics include package designs, materials, and processes for these three related device technologies. MEMS and MOEMS devices face considerable packaging challenges. Special packaging requirements will be covered in detail and a variety of options offered with a cost-reduction focus. Package types include metal, ceramic, wafer-level, non-hermetic plastic and near-hermetic injection molded cavity types. Hermeticity measurement, criteria, acceptable levels, and issues are discussed. In-package and on-chip “packaging agents,” such as getters, molecular coatings, and volatile anti-stiction/lubricants are included.

Packaging trends discussion encompasses cost-reduction with ceramic designs, hermetic capping to enable plastic overmolding, laser sealing, microinjection plastic cavity types, and the 100% WLP (wafer-level package). MEMS-specific commercial packaging information is provided and several successful case histories are described. Fluidic-MEMS, an important emerging area, is discussed including fluidic coupling and “pluggable” packaging.

Finally, requirements for future Nanotechnology devices will be predicted based on known properties of materials and the characteristics of experimental devices. The case will be made for the adoption of MEMS packaging for future Nanoelectronic devices. Find out if packaging Nanoelectronics will be a serious challenge or easier than expected - you may be surprised!

Who Should Attend?
Entry-Intermediate. Inventors, product developers, innovators, marketing personnel, analysts, equipment providers, and technologists in electronics, medical, biology, BioMed, analytical field, optoelectronics, materials, telecom systems, and military.

Dr. Ken Gilleo is a chemist, inventor, IP specialist, expert witness, writer and consultant in materials, printed circuits, plastic packaging, assembly and emerging technologies including MEMS, MOEMS and Nanotechnology. He developed getters, low cost plastic packages, adhesives and laser sealing for MEMS and MOEMS. He has produced over 500 articles, technical presentations and workshops and his 7th book, “MEMS/MOEMS Packaging” was published in late 2005. He has helped pioneer low-cost plastic packaging for MEMS and worked on packaging designs, materials and processes.

S10 - ½ Day Course: 1:00 pm - 5:00 pm CANCELLED
Alternative Energy Overview - What Got Us Here Has To Change
Course Leader: John Olenick, ENrG Incorporated


Monday, November 3, 2008

M1
Wire Bonding in Microelectronics
Course Leader: George G. Harman, National Institute of Standards and Technology

Course Description:
Wire bond manufacturing defects range typically from about 1000 to 100 ppm, with exceptions to >10,000 and <50 ppm. In order to achieve the lower numbers in production, one must understand all of the conditions that affect both bond yield and reliability (since they are interrelated). This course will discuss many small- and large-wire bonding problems, as well as subjects of specific interest to hybrid/MCM device bonding. In addition, a number of advanced topics, such as high yield, fine pitch (towards 25 µm ball bond pitch), and bonding to flex will be covered. Newer developments are included along with a major discussion of wire bonding to multichip substrates, soft substrates, Cu-Lok and the special intermetallic problems occurring when fine pitch chips are used. Wire bond testing and metallurgy (covering both aluminum and gold bonds); intermetallic compounds in general; cratering; cleaning for high yield and reliability; failures resulting from electroplating; mechanical problems in wire bonding; new bond technologies and developments; how ultrasonic bonds are formed; and the metallurgy of gold and aluminum wire. It concludes with methods of making very low loops, implementing TAB and Flip Chip by using wire bonding/stud bumping techniques.

Who Should Attend?
Engineers in R&D, QA, QC, manufacturing, process development, and advanced technicians. It is assumed that participants have some familiarity with wire bonding and general device assembly technologies.

Special Course Materials:
All attendees will receive a complimentary copy of Wire Bonding in Microelectronics, by George Harman, McGraw Hill, NY, 1997 (List price $80), as well as complete course notes and explanations.

Mr. Harman is a Fellow Emeritus of the National Institute of Standards and Technology (NIST), and a consultant. He received a BS in Physics from Virginia Polytechnic Institute & State University and a MS in Physics from the University of Maryland. Mr. Harman has published over 60 papers, two books on wire bonding, and holds four U.S. Patents. He was the 1995 President of ISHM and is a Fellow of IMAPS and the IEEE. He has received numerous awards for his work from IMAPS, IEEE, DVS, SME, and others. He has presented numerous talks, and has taught courses for the University of Arizona and IMAPS for over 15 years, as well as the IEEE, to name a few. He has presented many papers and given courses in the USA, Europe, and Asia.

M2
High-Performance Thermal Management Materials
Course Leader: Carl Zweben, Ph.D., Advanced Thermal Materials Consultant

Course Description:
The need for advanced thermal management and packaging materials is highlighted in the iNEMI 2007 Roadmap.  In response to this need, there have been revolutionary advances in the last few years.  There are now many low-CTE, low-density materials with thermal conductivities up to 1700 W/m-K (over four times that of copper).  Many are supplied by major corporations.  Advanced materials can reduce component and system cost. They can tailor PCB CTE, potentially eliminating the need for underfill.  They also can increase PCB thermal conductivity, allowing heat removal from the bottom, as well as the top of a chip.  There are a large and increasing number of  microelectronic and optoelectronic applications, including: substrates; PCBs; PCB cold plates; heat spreaders; heat sinks; thermal interface materials; microprocessor, RF and power packages; thermoelectric cooler heat sinks; laser diode and LED packages; plasma and LCD displays; photovoltaic packaging; and detectors.  This course covers the large and increasing number of high-performance thermal management materials, including properties, manufacturing processes, applications, cost, lessons learned, typical development programs, and future directions, including carbon nanotubes.  The course also discusses traditional thermal management materials, of which many packaging engineers are unaware.

Who Should Attend?
Engineers, scientists and managers involved in microelectronic, optoelectronic, photovoltaic and MEMS/MOEMS thermal management and packaging design, production and R&D; packaging and thermal materials suppliers.

Dr. Zweben, now an independent consultant, directed advanced thermal management and packaging materials R&D for over 30 years.  He was formerly Advanced Technology Manager and Division Fellow at GE Astro Space, where he was the first to use Al/SiC and other advanced materials in microelectronic, optoelectronic and photovoltaic packaging, and developed low-CTE PCBs.  Other affiliations have included Du Pont, Jet Propulsion Laboratory and the Georgia Tech NSF Packaging Research Center.  He was the first, and one of only two winners of both the GE One-in-a-Thousand and Engineer-of-the-Year awards. He is a Life Fellow of ASME, a Fellow of ASM and SAMPE, an Associate Fellow of AIAA, and has been a Distinguished Lecturer for AIAA and ASME.  He has published and lectured widely on advanced thermal management and packaging materials.

M3
Multilayer Co-fired Ceramics
Course Leaders: Aicha Elshabini, Ph.D., & Fred D. Barlow, Ph.D., University of Idaho

Course Description:
This course focuses on the materials, processes, design, and applications of Low Temperature Co-fired Ceramics (LTCC) and related technologies. The course will begin with a brief history and background of the technology.

A detailed discussion of the process flow and processes will cover each step used in the fabrication of LTCC substrates. A discussion of the material properties and design guidelines and considerations will also be covered in detail. Finally, a discussion of the technical advances and the technical applications of the technology will outline the relative strengths of LTCC for a number of target markets.

Topics:
• History of LTCC and Background
• LTCC Process
• Material Properties
• Design Considerations
• Technical Advances
• Applications

Special Course Material:
All attendees will receive a complimentary copy of Ceramic Interconnect Technology Handbook, by Fred D. Barlow, III and Aicha Elshabini, CRC Press 2007 (List Price $130).

Who Should Attend?
Engineers, managers, and technicians who desire to expand their background or strengthen their understanding of the technology.  The course will not assume any prerequisite background.

Aicha Elshabini is Professor of Electrical Engineering and Dean of Engineering at the University of Idaho. She obtained a B.Sc. in Electrical Engineering at Cairo University, a Masters in Electrical Engineering at University of Toledo, and a Ph.D. Degree in Electrical Engineering at the University of Colorado. She served as a faculty member at Virginia Tech in the period 1979-1999, the position of Professor and Department Head for the Electrical Engineering Department at University of Arkansas (1999-2006), and Interim Department Head for Computer Science & Computer Engineering Department (2000-2003). She served as the faculty advisor for the IMAPS student program at both Virginia Tech and University of Arkansas institutions from 1980 to 2006. Elshabini is a Fellow of IEEE/CPMT Society (1993) and a Fellow of IMAPS Society (1993). Dr. Elshabini was awarded the 1996 John A. Wagnon, Jr., Technical Achievement Award from IMAPS. She has served as the Founding Editor of the IMAPS International Journal of Microcircuits & Electronic Packaging for 10 years.

Fred Barlowearned a Bachelors of Science in Physics and Applied Physics from Emory University, a Masters of Science in Electrical Engineering from Virginia Tech, and a Ph.D. in Electrical Engineering from Virginia Tech. Dr. Barlow has published widely on electronic packaging and is Co-Editor of The Handbook of Thin Film Technology (McGraw Hill, 1998) & Co-Editor of the Ceramic Interconnect Technology Handbook (CRC Press 2007). In addition, he has written several book chapters including two chapters on thin films and one on components and devices. He is currently an Associate Professor of Electrical Engineering at the University of Idaho and serves as the Editor-in-Chief of the Journal of Microelectronics and Electronic Packaging.

M4
Hermeticity and “Near Hermetic” Packaging Concepts
Course Leaders: Thomas J. Green, TJ Green Associates LLC & Aaron Der Marderosian Sr., Raytheon Company

Course Description:
Hermeticity of electronics packages and hermeticity test techniques continue to be of critical importance to the microelectronics packaging community.  Specifically, in the area of MEMS/MOEMS packaging, medical implants, optoelectronic components and packaging for Military and Space.  In contrast to a hermetic cavity style package “near hermetic” high performance/low cost  packages made from teflon and LCP materials are in increasing demand by military OEMs.

This course begins with an overview of hermetic sealing processes.  The class will then examine the accepted leak test techniques as prescribed in Mil Standard 883 Test Method 1014. This misunderstood test method is often a source of frustration. We’ll discuss the many ways to test for hermeticity and equations that relate leak rates to moisture ingress, which is the primary concern in the final package configuration.

Optical Leak Test (OLT) is a method that makes use of a laser interferometer  to measure out plane deflection on a lid surface in response to a changing pressure and relates these measurements to an equivalent helium leak rate. Cumulative helium Leak Detection (CHLD), which can measure leak rates as low as 10E-13 He cc/sec will also be discussed.

Packages made from polymeric materials as opposed to traditional hermetic seals (i.e., metal, ceramic, etc.) require a different approach from a testing standpoint.  The problem is now one of moisture diffusion through the barrier and package interfaces.  A brief review of the techniques and methods to evaluate a “non-hermetic” approach is presented.

Special Course Material:
All attendees will receive a complimentary copy of Hermeticity of Electronic Packages, by Hal Greenhouse, Noyes Publications 2000 (List price $175) and a Practical Guide to TM 1014 authored by Mr. Green.

Who Should Attend?
This PDC is intended as an introductory to intermediate level course for process engineers, designers, quality engineers, and managers responsible for sealing, leak testing and RGA results and for those responsible for evaluating new polymeric cavity style packages.

Mr. Thomas Green is an independent consultant and Adjunct Professor at the National Training Center for Microelectronics.  He has over twenty-five years experience in the microelectronics industry and has worked at Lockheed Martin Astro Space and USAF Rome Laboratories. At Lockheed he was a Staff engineer responsible for the materials and manufacturing processes used in building custom high reliability space-qualified microcircuits for military and commercial communication satellites. Tom has demonstrated expertise in seam sealing and leak testing processes.   He has conducted experiments and presented technical papers at NIST (National Institute Standards and Technology) and IMAPS on leak testing techniques and optimization of seam welding processes through statistical DOE methods. Tom is an active IMAPS member and has a B.S. in Materials Engineering from Lehigh University and a Masters from the University of Utah.

Mr. Aaron Der Marderosian is an Engineering Fellow in the Mechanical Engineering Directorate, Materials Department at Raytheon Company in Sudbury, Mass.  He has been actively involved for more than 40 years in failure mode analysis and in particular, areas associated with moisture- related problems. He has authored more than 60 technical papers and presentations on a wide range of subjects on device reliability and failure mechanisms. His experiences include environmental testing, hermeticity test methods and specification, experimental stress analysis, accelerated test development, electrical properties of materials, humidity-related corrosion testing and analysis, component evaluation, chemical analysis and extensive instrumentation and evaluation of deployed systems.  Mr. Der Marderosian received his education at Northeastern University Dept. of Electrical Engineering and has lectured in their Center for Continuing Education.

M5
Introduction to Microelectronics Packaging Technology
Course Leader: Phillip G. Creter, Creter & Associates

Course Description:
This up-to-date and constantly revised course provides an introduction to microelectronics packaging using simple terms for ease of understanding. No prior knowledge of microelectronics required. Emphasis will be on visual aids including actual samples, a variety of photos and figures. The attendee will learn basic packaging definitions and current terminology of materials, processes and equipment, including: thick/thin film technology and nanotechnology as applied to microelectronics and semiconductor processing.

2008 updates include MEMS, SiP, RFID, Thru-Silicon Vias, Thin Chips/3D/WLP, Green Technology, and new metal/metal oxide transistors. An overview of major industry leaders includes Intel’s 45nm process, IBM’s C4NP, Freescale’s RCP, Samsung’s TSV, and Amkor’s SiP/SoP and StatsChipPac’s PoP.
Technical topics with video clip highlights include WLP, FC bumping, dicing, substrates (ceramic, conductors, dielectrics, co-fired, LTCC); components – passives, actives, chips vs. discrete SMT components and flip chip; assembly including details of basic package types (SO, LCC, CERDIP, QFP, QFN, BGA, stacked die, and plastic over molded lead frame). Also covered are die attach, wire bonding, micro soldering, plating, rework & repair, final assembly including elements of visual inspection, test, hermeticity, reliability, failure analysis, design, cleanrooms and handling techniques.

A 250+ page invaluable class handout includes an expanded glossary and list of references.

Who Should Attend?
Designed primarily for entry-level R&D/manufacturing/quality technicians/engineers or others with little knowledge of microelectronics packaging but also includes topics of interest for senior engineers’ overview, sales/marketing, purchasing, safety and management.

Phillip Creter has over 30 years of microelectronics packaging experience and is a Life member of IMAPS. He was elected a Fellow of the Society, National Treasurer and President of the New England Chapter (twice). He received a BS in Chemistry from Suffolk University and has published numerous papers, holds a U.S. patent, has given many technical presentations (received Best Paper of Session award IMAPS 1998) and chaired technical sessions for symposia. He is currently a consultant with experience at Polymer Flip Chip Corporation, Mini-Systems, GTE and Itek Corporation. His past positions include GTE Microelectronics Center Manager (receiving coveted Lesley Warner Technical Achievement Award), Process Engineering Manager, Process Development Manager, Materials Engineering Manager and Manufacturing Engineer. Phil currently teaches courses at microelectronics events and for the Department of Homeland Security.

M6
Plating Processes for High Reliability Microelectronic Devices
Course Leader: Fred Mueller, Consultant, ASEF Instructor

Course Description:         
• Provide a thorough overview of the chemistries of nickel, gold, and other precious metals that can be deposited by electro/electroless plating on a variety of applications in the field of electronics;
• Present methods for controlling the properties of plating solutions to maximize the deposits properties;
• Understand the use of Laboratory controls including the Hull Cell and other plating cells to test solutions;
• Highlight the engineering differences and troubleshooting problems in plating processes used in Plating for Electronics.

Special Course Materials:
All attendees will receive a copy of Plating for Electronics (an AESF Publication).

Who Should Attend?
This course is intended as an introductory to intermediate level course for process engineers, quality engineers, and managers responsible for Electronic Finishing.

Mr. Mueller is a consultant and serves as a national certified instructor for the American Electroplaters and Surface Finishing Foundation (AESF).  He has over twenty-five years experience in the plating industry in printed circuits and plating for electronics.  He is currently the Corporate Quality Manager at General Magnaplate, Linden, NJ.  As a Chemist, Fred has conducted experiments and presented technical papers at SurFin on various topics in electroplating. He has served as Chairman of the Quality in Surface Finishing Committee and the Electro-forming Committee of the AESF.

M7
Failures and their Prevention in Electronic Assemblies with focus on Lead (Pb)-Free Technology
Course Leader: Dr. Puligandla Viswanadham, University of Texas at Arlington

Course Description:
This course provides a comprehensive account of the commonly observed failures in electronic assemblies, their modes and mechanisms. It begins with an overview of packaging hierarchy, followed by why failures occur, the methods to detect and analyze them. The module then explores some real life failures in PWBs, components, and assemblies.

Assembly with Lead (Pb)-free alloys is relatively new, considering the long history and experience with eutectic Sn/Pb. Understanding of the performance of Pb-free interconnections under a variety of loading conditions is in its infancy. Compositional variations in the Pb-free alloy can have significant impact on the interconnection behavior under different loading conditions. While Sn-Ag-Cu alloy is a three-component system, the joint itself can be of five or six components. Variations in the alloy, the PWB surface and component finishes, and assembly process can cause variation in performance and reliability. A variety of failure mechanisms, different from the ones with eutectic Sn/Pb solders, were reported. Influence of minor elements on the behavior of Pb-free solders is not adequately explored. There is need for a better understanding of Pb-free solders to ensure product performance and reliability since their implementation has already started. Materials & microstructural aspects, unique failure modes & mechanisms will be covered along with a discussion of prevention.

Who Should Attend?
As an introductory to intermediate level course in materials, design, process aspects of electronic assembly failures and their prevention, it is beneficial to those entering the electronic packaging industry, process engineers, managers, and those involved in (Pb)-free technology.

Dr. Puligandla Viswanadham is an Adjunct faculty at the University of Texas at Arlington, Texas. He recently retired as a Principal Scientist at Nokia, Irving, Texas. He worked, in the past at Raytheon and & TI as Senior Member of the Technical Staff, and at IBM as Advisory Engineer. He authored/co-authored over 125 papers, 8 book chapters, and a book on Failure Modes and Mechanisms in Electronic Packages. He holds 7 patents and 15 invention disclosures. He is currently preparing books on portable electronics and fundamentals of electronic packaging. He received the Third IBM Invention Achievement Award, an Excellence Award, and a Fourth Level Author Recognition Award. He was on the faculty of Ohio Dominican College, Columbus, Ohio (1974-78).His experience encompasses Advanced Packaging and Laminate Technologies, Reliability, Failure Analysis and (Pb)-Free technology. He is a member of SMTA.

M8 - ½ Day Course: 8:00 am - Noon
Advances in 3D Integration and Packaging

Course Leader: James Jian-Qiang Lu, Ph.D., Rensselaer Polytechnic Institute

Course Description:
An overview of 3D integration and packaging will be presented, including motivation, key technologies and status towards commercialization.  The major motivations discussed include miniaturization of micro-systems; performance increase in speed and data bandwidth due to massive small-sized Through-Strata-Vias (TSVs); heterogeneous system integration of a variety of technologies; and lower manufacturing cost for specific 3D applications.

In this course, 3D integration technologies are divided into 4 categories – transistor build-up, wafer-to-wafer stack, die-on-wafer assembly, and packaging-based 3D. In transistor build-up 3D, active devices are built-up over an IC wafer. In wafer-to-wafer stack 3D, different systems are first fabricated independently and then stacked and interconnected vertically. The die-on-wafer assembly is similar to SoC approach, but with known-good-dies (KGDs) assembled on a wafer, then processed in wafer-level. In the last category, the ICs are packaged vertically in die-to-die, system-in-packaging (SiP) and package-on-package (PoP) fashions.

This course will discuss all these technologies, with emphasis on technology status and potential applications. The issues associated with each technology category will be discussed, including integration architecture and design tools, yield and cost, thermal and mechanical constraints, and manufacturing infrastructure. Finally, future directions into micro/nano/electro-opto/bio system hyper-integrations including MEMS will be presented, showing 3D hyper-integration as a very promising emerging architecture for future computer, network, nanotech, and biotech.

Who Should Attend?
Engineers, managers and executives involved in future R&D investments, assembly and product development of electronic packaging, and wanting fundamental understanding of 3D technologies, as well as the materials and equipment suppliers wanting to know about the existing and future 3D integration technologies and options, will greatly benefit from this course.

James Jian-Qiang Lu received his Dr. rer. nat. (Ph.D.) degree from Technical University of Munich in December 1995, and is currently an Associate Professor in Electrical Engineering at Rensselaer Polytechnic Institute (RPI), Troy, NY.  At RPI, Dr. Lu has been leading the Interconnect Focus Center (IFC) research program of 3D hyper-integration technology since 1999, and several other programs with focus on hyper-integration and micro-nano-bio interfaces for future chips. He has >170 publications, and gave a number of invited presentations, seminars and short courses.  He served as technical chair, workshop chair, session chair, panelist and panel moderator for many conferences.  He is a senior member of IEEE, a member of APS, MRS, ECS, and a member of IMAPS National Technical Committee (Chair of 3D Packaging). He received the 2008 IEEE CPMT Exceptional Technical Achievement Award in recognition of his exceptional technical achievements as a pioneer and technical leader in 3D integration/packaging.

M9 - ½ Day Course: 1:00 pm - 5:00 pm
Biomedical Materials, Devices and Packaging
Course Leader: Z. Joan Delalic, Ph.D., Temple University

Course Description:
The basic objective of this workshop is to provide material to professional engineers and scientists who work in design, packaging, and manufacturing of medical devices.  The course will emphasize the latest research in drug delivery and implantable devices for sensing and diagnostic purposes.

Biomedical engineering is divided into multiple components—large equipment for diagnostic purposes, smaller portable equipment for home/hospital use, sensors and MEMS/NEMS to measure and/or enhance specific body function and the latest drug delivery devices. Recent developments in high power microscopy are allowing the development of implantable micro/nano devices.

The materials used for packaging implantable biomedical devices must address issues in the selection of proper bio-materials from biocompatibility to bio-stability to structure/function relationships. The focus of this workshop is the use of specific biomaterials based on their physiochemical and mechanical characterizations.

Many studies are being conducted in numerous laboratories to develop nanoscale bio-structures. These structures can mimic or affect a biological process or interact with a biological entity. The structures include numerous micro/nano scale sensors that work using physical properties of bulk materials via complex mechanical and electronic apparatus.

The ultimate goal for this PDC is to introduce a novel approach in designing, packaging, and defining bio-compatible materials for bio-devices used as implantable, monitoring,  drug delivery and replacement of bio-parts devices, MEMS/NEMS, etc. The latest technological development in nanotechnology that could be applied to bio-medical devices will be emphasized.

Who should attend?
This PDC course is intended as an introductory to intermediate level course for packaging engineers, designers, materials engineers, and engineering managers.

Dr. Z. Joan Delalic is a Professor in the Department of Electrical and Computer Engineering, Temple University. She has a BS and MS in Electrical Engineering and a PhD in Bioelectronics. She is currently involved in Biomedical and Nanotechnology research. Her involvement in biomedical research involves different types of implantable sensors for measuring various biological functions. Her nanotechnology research involves the development of implantable structures for drug delivery to tumors.

 


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