IMAPS PDC Webinar Series on
Hermeticity Packaging Concepts

This three-session on-line Professional Development Course (PDC) webinar was held:
Monday, October 6, Tuesday, October 14, and Tuesday, October 21, 2008
All webinars were held 12:00 noon - 1:00 pm EST

Registration:
IMAPS Members: $125 per webinar; 3-course series $250
Non-members: $200 per webinar; 3-course series $500

Click on the linked Webinar Titles below to purchase/download

Key Words

Hermeticity, hermetic sealing, helium leak, OLT, CHLD, gross and fine leaks, TM 1014

Program Description

Hermeticity of electronics packages and hermeticity test techniques continue to be of critical importance to the microelectronics packaging community.  Specifically, in the area of MEMS/MOEMS packaging, medical implants, optoelectronic components and packaging for Military and Space.  This on-line PDC is a series of 3 one hour lectures which can be taken in total or separately depending on the experience level of the student and topics of interest.  Below is a course outline for each session.  Each session is scheduled for 50 minutes of lecture followed by 10 minutes of Q&A.

Monday, October 6 -- 12:00-1:00 PM EST

In this lead off session the basic concept of hermeticity will be defined.  There are a variety of ways to create a hermetic seal each one of these will be briefly discussed from a material and processing standpoint. Then the basic theory of moisture ingress and rationale for the military RGA 5000 PPM specification will be described.  

• Hermeticity defined…A reason to seal
• Hermetic seal processes
• Moisture ingress into a sealed package
• Residual Gas Analysis and the military specification 

Tuesday, October 14 -- 12:00-1:00 PM EST

In this session we’ll examine the conventional helium fine and gross leak test techniques as prescribed in Mil Standard 883 Test Method 1014. This misunderstood test method is often a source of frustration.  We’ll discuss the theory behind the test method and point out some of the common pitfalls.

• Helium Fine Leak Testing
• Howl and Mann Flexible equation
• Fixed Table method
• Gross leak bubble testing

Tuesday, October 21 -- 12:00-1:00 PM EST

Optical Leak Test (OLT) is a method that makes use of a laser interferometer to measure out plane deflection on a lid surface in response to a changing pressure and relates these measurements to an equivalent helium leak rate.  Cumulative Helium Leak Detection (CHLD) is a hermeticity test technique that can measure leak rates as low as 10E-13 He cc/sec.   Both  methods allow for both gross and fine leak detection in a single test cycle and without the use of a liquid.

• Optical Leak Testing (OLT)
• Cumulative Helium Leak Detection (CHLD)

Who Should Attend?

This PDC is intended as an introductory to intermediate level course for process engineers, designers, quality engineers, and managers responsible for sealing, leak testing and RGA results and for those responsible for evaluating new polymeric cavity style packages.

Course attendees will have access to all the course notes and in addition will receive a complimentary complementary copy of "Practical Guide to TM 1014" authored by the Instructor.

Presenter Mr. Thomas Green is an independent consultant and the Technical Director at TJ Green Associates LLC, a Veteran-owned small business. He has over twenty-five years experience in the microelectronics industry and has worked at Lockheed Martin Astro Space and USAF Rome Laboratories. At Lockheed he was a Staff engineer responsible for the materials and manufacturing processes used in building custom high reliability space qualified microcircuits for military and commercial communication satellites. Tom has demonstrated expertise in seam sealing and leak testing processes. He has conducted experiments and presented technical papers at NIST (National Institute Standards and Technology) and IMAPS on leak testing techniques and optimization of seam welding processes through statistical DOE methods. He has experience with OLT (Optical Leak Technology) and CHLD (Cumulative Helium Leak Detection). Tom is an active IMAPS member and has a B.S. in Materials Engineering for Lehigh University and a Masters from the University of Utah.