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IMAPS PDC Webinar Series on
Component Authentication and Screening

This two-session on-line Professional Development Course (PDC) webinar was held:
Wednesdays, October 6 and 13, 2010

All webinars were held 12:00 noon - 1:00 pm EASTERN

Registration:
IMAPS Members: $125 per webinar; 2-course series $200
Non-members: $200 per webinar; 2-course series $375 (includes one-year complimentary individual membership in IMAPS)

Registration Deadline: October 5, 2010


Keywords

counterfeit EEE, supply chain, authentication, testing and characterization

Program Description

Counterfeit electronics have been reported in a wide range of products, including computers, telecommunications equipment, automobiles, avionics and military systems. Counterfeit electronic products include everything from very inexpensive surface mount capacitors and resistors to expensive microprocessors. Unfortunately, the counterfeit EEE component problem is growing rapidly and no signs of abatement are in sight.

The webinar begins with an introduction to electronic parts supply chain, the sources of authorized and unauthorized parts. Attendees will learn about the status of the electronic part distribution market and how it has changed over the past decade. The movement of the manufacturing and technology know-how across the globe will be covered to understand the international aspect of the counterfeit electronics supply chain. This part is followed by information on the extent of the counterfeit electronics problem with illustrative examples that emphasize the aspects of supply chain.

The webinar further covers the tools and techniques that engineers need to understand for determining the risk levels of components that require authentication. Basic inspection and electrical testing will be covered with an emphasis on the tools and techniques necessary for positive identification of parts that are not authentic in their
representation. Attendees will also learn how to effectively engage specialist electrical and material testing laboratories in a cost effective manner to determine risk of counterfeit components.

Lecture topics in webinar will include:

  • Electronic part supply chain
  • Counterfeit parts: types and examples
  • Sources of counterfeit parts
  • Mitigation techniques and few anti-counterfeiting efforts
  • Testing and characterization
  • Electrical Characterization
    o Optical Microscopy
    o X-Ray Microscopy
    o Scanning Acoustic Microscopy
    o X-ray fluorescence Spectroscopy
    o Environmental Scanning Electron Microscopy (ESEM) / Energy
    Dispersive Spectroscopy (EDS)
    o Materials Characterization Tools

Target Audience

Component engineers, Engineering managers, Procurement Managers, Quality Managers, Failure Analysts, Contracts personnel and anybody who is involved in policy making activities in fields of marketing or procurement of electronics parts or assemblies.

Bhanu Sood

Presenter

Bhanu Sood is the Director of the Test Services and Failure Analysis (TSFA) Laboratory at the University of Maryland's Center for Advanced Life Cycle Engineering (CALCE). He holds Masters Degrees in Advance Materials Processing and Materials Science, and a Bachelors Degree in Mechanical Engineering.

His research areas include electronic materials characterization, electronics part authentication techniques, investigation into failure/degradation modes and mechanisms in lithium-ion batteries, electronic components, assemblies and, printed circuit board (PCB) materials. Prior to joining CALCE in 2005 Mr. Sood worked at U.S. Naval Research Laboratory (NRL) in the areas of embedded electronics, micro-power sources, Laser assisted micro-fabrication, characterization of electrically conductive polymeric formulations and advanced materials. His technical publications include papers on failure site isolation techniques, PCB materials, embedded electronics, energy storage systems and instrumentation for mechanical studies. Mr. Sood has taught numerous industry courses in the areas of electronics reliability, root cause failure analysis techniques and materials characterization tools.

Email: bpsood@calce.umd.edu

 

 

 



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